Methods for determining wafer temperature
View Patent ↗Methods and apparatus for wafer temperature measurement and calibration of temperature measurement devices may be based on determining the absorption of a layer in a semiconductor wafer. The absorption may be determined by directing light towards the wafer and measuring light reflected from the wafer from below the surface upon which the incident light impinges. Calibration wafers and measurement systems may be arranged and configured so that light reflected at predetermined angles to the wafer surface is measured and other light is not. Measurements may also be based on evaluating the degree of contrast in an image of a pattern in or on the wafer. Other measurements may utilize a determination of an optical path length within the wafer alongside a temperature determination based on reflected or transmitted light.
1. A method for determining the temperature of an object, the method comprising:
directing coherent energy towards an object such that the object interacts with the coherent energy;
directing incoherent energy towards the object such that the object interacts with the incoherent energy;
determining an absolute temperature of the object based upon measuring the incoherent energy after interaction with the object;
performing a first optical measurement of the coherent energy after interaction with the object;
changing the temperature of the object to a second temperature;
performing a second optical measurement of the coherent energy after interaction with the object at the second temperature;
determining a change in an optical path length within the object based on the first and second optical measurements; and
determining the temperature change based on the difference in the optical path length.
2. The method as set forth in claim 1 , wherein determining the absolute temperature of the object includes determining the degree of absorption in the object based on at least one of: measurement of incoherent energy reflected from the object; measurement of incoherent energy transmitted through the object.
3. The method as set forth in claim 1 , where at least one of the coherent energy and the incoherent energy is varied in time.
4. The method as set forth in claim 1 , further comprising measuring the temperature of the object using a temperature measurement device and calibrating the temperature measurement device based on the determined absolute temperature and temperature change.
5. The method as set forth in claim 1 , wherein the object comprises a semiconductor process wafer.
6. The method as set forth in claim 1 , wherein the object comprises a calibration wafer.
7. The method set forth in claim 1 , wherein the optical measurements are based on detecting energy over a bandwidth less than 16 nm.
8. The method set forth in claim 1 , wherein the optical measurements are based on detecting laser light over a bandwidth less than 3 nm.
9. The method set forth in claim 1 , wherein determining the absolute temperature of the object is based on measurement of energy transmitted through the object.
10. The method set forth in claim 9 , wherein the optical measurements are based on detecting energy over a bandwidth less than 16 nm.
11. The method set forth in claim 9 , wherein, the optical measurements are based on detecting laser light over a bandwidth less than 3 nm.
12. A method as defined in claim 4 , wherein the temperature measurement device comprises a pyrometer.
13. A method as defined in claim 1 , further comprising the step of determining the second temperature based on the determined temperature change and the absolute temperature.