Optimizing use and performance of optical systems implemented with telecentric on-axis dark field illumination
View Patent ↗Systems and methods are provided for imaging a planar specular object such as a semiconductor wafer. In one embodiment, an imaging system for imaging a defect on a planar specular object includes a telecentric lens having a sufficiently aspherical surface such that the telecentric lens is substantially corrected for an optical aberration. The imaging system also includes a telecentric stop including an aperture therein to block light reflected from the planar specular object while allowing light reflected from the defect to pass through the aperture. The imaging system further includes a lens group having a system stop positioned between the telecentric stop and the lens group. The lens group is substantially corrected for the optical aberration independent of the telecentric lens.
1. An imaging system for imaging a defect on a planar specular object, the imaging system comprising:
a telecentric lens having a sufficiently aspherical surface such that the telecentric lens is substantially corrected for an optical aberration;
a telecentric stop including an aperture therein to block light reflected from the planar specular object while allowing light reflected from the defect to pass through the aperture; and
a lens group having a system stop positioned between the telecentric stop and the lens group, the lens group being substantially corrected for the optical aberration independent of the telecentric lens.
2. The imaging system of claim 1 , further comprising a camera for imaging the planar specular object through the telecentric lens, the telecentric stop, and the lens group.
3. The imaging system of claim 2 wherein the camera comprises a complementary metal-oxide semiconductor (CMOS) sensor.
4. The imaging system of claim 3 wherein the imaging system has a depth of focus of approximately ±10 mm.
5. The imaging system of claim 1 , wherein the telecentric lens comprises a molded polymer.
6. The imaging system of claim 1 , wherein the optical aberration comprises spherical aberration.
7. The imaging system of claim 1 , wherein the lens group comprises a pinhole lens.
8. The imaging system of claim 1 , further comprising a source of illumination positioned to illuminate the planar specular object along an axis of the telecentric lens.
9. The imaging system of claim 1 , wherein the source of illumination comprises two or more concentric arrays of light emitting diodes (LEDs).
10. The imaging system of claim 9 , wherein successive concentric arrays in the two or more concentric arrays of LEDs alternate between being tangentially arranged and radially arranged with respect to a common center point.