Compositions for preparing low dielectric materials
View Patent ↗Low dielectric materials and films comprising same have been identified for improved performance when used as performance materials, for example, in interlevel dielectrics integrated circuits as well as methods for making same. In one aspect of the present invention, the performance of the dielectric material may be improved by controlling the weight percentage of ethylene oxide groups in the at least one porogen.
1. A composition for producing a performance material having a dielectric constant of about 3.7 or less, the composition consisting of:
an at least one silica source wherein the at least one silica source contains at least one non-halogen containing monovalent organic group;
an at least one porogen comprising from about 5 weight percent to about 75 weight percent ethylene oxide groups;
a carboxylate selected from the group consisting of a carboxylic acid, a carboxylate anion, a carboxylic acid ester, or combinations thereof;
an at least one solvent;
optionally a catalyst; and
water,
wherein the molar ratio of R to Si in the composition ranges from 0.2 to 0.8;
wherein a molar ratio of the carboxylate to the at least one silica source in the composition is 0.1 or greater, and provided that if the at least one chemical reagent has a metal impurity level of 1 ppm or greater then the at least one chemical reagent is purified prior to adding to the mixture.
2. A composition for producing a performance material having a dielectric constant of about 3.7 or less, the composition consisting of:
an at least one silica source;
an at least one porogen comprising from about 5 weight percent to about 75 weight percent ethylene oxide group;
a carboxylate selected from the group consisting of a carboxylic acid, a carboxylate anion, acarboxylic acid ester, or combinations thereof;
an at least one solvent;
optionally a catalyst; and
water
wherein a molar ratio of the carboxylate to the at least one silica source in the mixture is 0.1 or greater, and provided that if the at least one chemical reagent has a metal impurity level of 1 ppm or greater than the at least one chemical reagent is purified prior to adding to the mixture.
3. The composition of claim 2 wherein themolar ratio of R to Si in the composition ranges from 0.2 to 0.8.