IP Library Granted Patent US 7,525,846
Granted Patent B2
US 7,525,846 · App. 11/485,553 · Granted Apr 28, 2009

Memory device

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Quick Facts
Patent No.
US 7,525,846
App. No.
11/485,553
Granted
Apr 28, 2009
Kind
B2
Abstract

A memory device includes a memory cell having a capacitor for accumulating electric charges in accordance with the logic of data, a bit line connected to the memory cell, a charge transfer circuit for transferring the electric charges in the bit line to an output node, a dummy memory cell connected to the bit line, and a control circuit for controlling the charge transfer ability of the charge transfer circuit in accordance with the change in the voltage of the bit line.

Claims (44)

1. A memory device comprising:

a memory cell having a capacitor to accumulate electric charges in accordance with logic of data;

a bit line connected to said memory cell;

a charge transfer circuit to transfer the electric charges of said bit line to an output node;

a dummy memory cell to store fixed data and connected to said bit line; and

a control circuit to control the charge transfer ability of said charge transfer circuit in accordance with a change in the voltage of said bit line.

2. The memory device according to claim 1 , wherein said dummy memory cell has a capacitor connected to said bit line via a transistor.

3. The memory device according to claim 2 , wherein said memory cell and said dummy memory cell have a ferroelectric capacitor.

4. The memory device according to claim 1 , wherein said dummy memory cell has a capacitor connected to said bit line.

5. The memory device according to claim 1 , further comprising an output node initialization circuit to initialize the voltage of said output node and a charge transfer initialization circuit to initialize the charge transfer ability of said charge transfer circuit.

6. The memory device according to claim 5 , wherein said output node initialization circuit initializes said output node to a negative voltage.

7. The memory device according to claim 6 , further comprising a level shift circuit to shift in level the voltage of said output node.

8. The memory device according to claim 5 , wherein:

said charge transfer circuit has a first field effect transistor connected between said bit line and said output node;

said control circuit has a first inverter the input of which is connected to said bit line via a first capacitor and the output of which is connected to the gate of said first field effect transistor via a second capacitor;

said output node initialization circuit has a second inverter connected to said output node via a third capacitor; and

said charge transfer initialization circuit has a fourth capacitor connected to the gate of said first field effect transistor, a second field effect transistor connected between said fourth capacitor and the high level voltage, and a third field effect transistor connected between said fourth capacitor and the ground voltage.

9. The memory device according to claim 1 , wherein:

said charge transfer circuit has a first field effect transistor connected between said bit line and said output node; and

said control circuit has a first inverter the input of which is connected to said bit line via a first capacitor and the output of which is connected to the gate of said first field effect transistor via a second capacitor.

10. The memory device according to claim 1 , wherein said memory cell has a ferroelectric capacitor.

11. A memory device comprising:

a memory cell having a capacitor to accumulate electric charges in accordance with logic of data;

a bit line connected to said memory cell;

a charge transfer circuit to transfer the electric charges of said bit line to an output node;

a current supply circuit to supply a current from the ground voltage to said output node by connecting between said output node and a node of the around voltage; and

a control circuit to control the charge transfer ability of said charge transfer circuit in accordance with a change in the voltage of said bit line.

12. The memory device according to claim 11 , wherein said control circuit controls the charge transfer ability of said charge transfer circuit and said current supply circuit in accordance with the change in the voltage of said bit line.

13. The memory device according to claim 12 , further comprising:

an output node initialization circuit to initialize the voltage of said output node; and

a charge transfer initialization circuit to initialize the charge transfer ability of said charge transfer circuit and said current supply circuit.

14. The memory device according to claim 13 , wherein said output node initialization circuit initializes said output node to a negative voltage.

15. The memory device according to claim 14 , further comprising a level shift circuit to shift in level the voltage of said output node.

16. The memory device according to claim 13 , wherein:

said charge transfer circuit has a first field effect transistor connected between said bit line and said output node;

said control circuit has a first inverter the input of which is connected to said bit line via a first capacitor and the output of which is connected to the gate of said first field effect transistor via a second capacitor;

said output node initialization circuit has a second inverter connected to said output node via a third capacitor;

said charge transfer initialization circuit has a fourth capacitor connected to the gate of said first field effect transistor, a second field effect transistor connected between said fourth capacitor and the high level voltage, and a third field effect transistor connected between said fourth capacitor and the ground voltage; and

said current supply circuit has a fourth field effect transistor the source and drain of which are connected to the ground voltage and said output node, and the gate of which is connected to the gate of said first field effect transistor.

17. The memory device according to claim 11 , wherein:

said charge transfer circuit has a first field effect transistor connected between said bit line and said output node;

said control circuit has a first inverter the input of which is connected to said bit line via a first capacitor and the output of which is connected to the gate of said first field effect transistor via a second capacitor; and

said current supply circuit has a second field effect transistor the source and drain of which are connected to the ground voltage and said output node, and the gate of which is connected to the gate of said first field effect transistor.

18. The memory device according to claim 11 , wherein said memory cell has a ferroelectric capacitor.

Assignments (4)
CHANGE OF ADDRESS Recorded Dec 23, 2016
From: FUJITSU SEMICONDUCTOR LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 041188/0401 →
CHANGE OF NAME Recorded Sep 27, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 025046/0478 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 9, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021976/0089 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 13, 2006
From: MORITA, KEIZO; KAWASHIMA, SHOICHIRO
To: FUJITSU LIMITED
Reel/Frame 018103/0588 →