IP Library Granted Patent US 7,910,154
Granted Patent B2
US 7,910,154 · App. 11/505,341 · Granted Mar 22, 2011

Nitride-based light emitting devices and methods of manufacturing the same

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Quick Facts
Patent No.
US 7,910,154
App. No.
11/505,341
Granted
Mar 22, 2011
Kind
B2
Abstract

A light emitting device may include an n-clad layer formed on a crystalline wafer; a porous layer formed by processing the n-clad layer in a mixed gas atmosphere of HCl and NH 3 . The light emitting device may further include an active layer and a p-clad layer formed on the porous layer.

Claims (23)

1. A method of manufacturing a light emitting device, the method comprising:

forming an n-clad layer on a crystalline wafer;

forming a porous layer by processing the n-clad layer in a gas atmosphere of HCl and NH 3 after the forming the n-clad layer; and

sequentially forming an active layer and a p-clad layer on the porous layer.

2. The method of claim 1 , wherein processing the n-clad layer is performed at a temperature of about 950° C. to about 1200° C., inclusive.

3. The method of claim 2 , wherein processing the n-clad layer is performed at a temperature of about 1065° C.

4. The method of claim 1 , wherein processing the n-clad layer is performed in a halide or hydride vapor phase epitaxy (HVPE) system.

5. The method of claim 1 , wherein a mixture ratio of HCl and NH 3 is about 1:10.

6. The method of claim 1 , wherein the gas further includes a carrier gas.

7. The method of claim 6 , wherein the carrier gas includes at least one of N 2 , Ar and H 2 .

8. The method of claim 6 , wherein a mixture ratio of HCl, NH 3 and the carrier gas is about 1:10:80.

9. The method of claim 1 , wherein the porous layer is formed to a thickness of about 1 μm to about 10 μm inclusive.

10. The method of claim 1 , wherein the crystalline wafer is a Si, GaAs, SiC, GaN or sapphire substrate.

11. The method of claim 1 , wherein the n-clad layer is an n-GaN layer and the p-clad layer is a p-GaN layer.

12. The method of claim 1 , wherein the active layer has a multi-quantum well (MQW) structure.

13. The method of claim 12 , wherein the active layer has a GaN/InGaN/GaN MQW or GaN/AlGaN/GaN MQW structure.

14. The method of claim 1 , wherein the n-clad layer, the active layer and the p-clad layer are formed using vapor deposition.

15. The method of claim 14 , wherein the vapor deposition is one of halide or hydride vapor phase epitaxy (HVPE), metal organic chemical vapor deposition (MOCVD) or molecular beam epitaxy (MBE).

16. A method of manufacturing a light emitting device, the method comprising:

forming an n-clad layer on a crystalline wafer;

forming a porous layer including a plurality of pillars by processing the n-clad layer in a gas atmosphere of HCl and NH 3 after the forming the n-clad layer;

forming an active layer of dots on the pillars, the dots each separated from each other; and

forming a p-clad layer on the active layer.

Assignments (4)
CHANGE OF NAME Recorded Aug 6, 2010
From: SAMSUNG CORNING PRECISION GLASS CO., LTD.
To: SAMSUNG CORNING PRECISION MATERIALS CO., LTD.
Reel/Frame 024804/0238 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE/ASSIGNOR PREVIOUSLY RECORDED ON REEL 020624 FRAME 0240. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER. Recorded May 16, 2008
From: SAMSUNG CORNING CO., LTD.
To: SAMSUNG CORNING PRECISION GLASS CO., LTD.
Reel/Frame 020956/0832 →
MERGER Recorded Mar 10, 2008
From: SAMSUNG CORNING PRECISION GLASS CO., LTD.
To: SAMSUNG CORNING CO., LTD.
Reel/Frame 020624/0240 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 17, 2006
From: PARK, SUNG-SOO
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 018205/0841 →