Method for validation of thermal solution for an electronic component
In one embodiment a method includes operating a component coupled to the system at a first steady state average power consumption, measuring the temperature of the component to produce a first temperature measurement, operating the component at a second, higher power consumption for a first time period, and measuring the temperature of the component at the end of the first time period to produce a second temperature measurement. A transient thermal metric is calculated based at least in part on the first and second temperature measurements, and the transient thermal metric is used to infer the thermal coupling status of a heat dissipation appliance that is nominally thermally coupled to the component.
1. A method of operating an information handling system (IHS), the method comprising:
operating a component coupled to the system at a first steady state average power consumption;
measuring the temperature of the component to produce a first temperature measurement;
operating the component at a second, higher power consumption for at least a first time period;
measuring the temperature of the component at the end of the first time period to produce a second temperature measurement;
calculating a transient thermal metric based at least in part on the first and second temperature measurements; and
using the transient thermal metric to infer a physical bond line phase change thermal interface material coupling status of a heat dissipation appliance that is thermally coupled to the component.
2. The method of claim 1 , wherein operating the component at the first steady state average power consumption comprises placing the component in an idle state for a period of time sufficient to allow the component temperature to substantially stabilize.
3. The method of claim 1 , wherein the component is a memory buffer coupled to the system by a memory bus.
4. The method of claim 3 , wherein the memory buffer is located on a memory module coupled to the system.
5. The method of claim 3 , wherein the memory buffer is located on a common circuit board with a processor coupled to the memory buffer through the memory bus.
6. The method of claim 1 , wherein measuring the temperature of the component comprises the component sensing its internal temperature with an on-board sensor.
7. The method of claim 6 , further comprising:
the component placing the sensed internal temperature measurements in an on-board register accessible to the IHS, and the IHS retrieving the sensed internal temperature measurements from the on-board register.
8. The method of claim 1 , wherein operating the component at the second, higher power consumption comprises operating the component at a substantially full load condition.
9. The method of claim 1 , wherein calculating the transient thermal metric comprises calculating a temperature difference between the second and first temperature measurements.
10. The method of claim 1 , wherein calculating the transient thermal metric comprises estimating a thermal slope based at least on the first and second temperature measurements.
11. The method of claim 1 , wherein using the transient thermal metric to infer the thermal coupling status of the heat dissipation appliance comprises comparing the metric to expected metric characteristics for the component and heat dissipation appliance.
12. The method of claim 11 , wherein the expected metric characteristics represent a baseline test.
13. The method of claim 12 , further comprising:
performing the baseline test on similar components and heat dissipation appliances with known thermal coupling status.
14. The method of claim 12 , further comprising:
performing the baseline test on the component at an earlier testing date.
15. The method of claim 11 , further comprising:
generating a notification when the inferred thermal coupling status is suboptimal.
16. An information handling system (IHS) capable of electrical coupling with a component thermally coupled to a heat dissipation appliance, the IHS comprising:
at least one processor, the component at least partially controllable by the processor when the component is electrically coupled to the system; and
a routine, executable by the processor, to shift the component from a first power consumption condition to a second power consumption condition and observe at least one component temperature difference responsive to the shift, the routine operable to test a physical bond line phase change thermal interface material coupling of the component to the heat dissipation appliance.
17. The IHS of claim 16 , wherein the component is a modular component and the IHS comprises a test fixture for the modular component.
18. The IHS of claim 16 , wherein the component is an operational component of the IHS.
19. The IHS of claim 18 , wherein the component comprises a memory buffer.
20. The IHS of claim 19 , wherein the memory buffer is mounted on a common circuit board with the processor.
21. The IHS of claim 19 , wherein the memory buffer is mounted on a memory module coupled to the IHS.
22. The IHS of claim 16 , wherein the component comprises a temperature sensor that senses the on-board temperature of the component, the sensed temperature accessible to the processor.