Semiconductor device and a method of testing the same

1. A semiconductor device wherein:

each of a plurality of current paths comprises a plurality of switching elements which control turning on or off of a current in response to input digital signals, so that a signal or signals corresponding to a sum of currents flowing through said turned-on current paths is/are output from an output terminal or terminals;

said plurality of switching elements are controllable to turn on or off independently of each other in response to said input digital signals; and

during testing, operation of said current paths can be confirmed by a functional test through controlling turning-on or off of said switching elements with said input digital signals to output logical signals from said output terminal or terminals, and comparing said logical signals with expected value to determine matching therebetween.

2. A semiconductor device comprising:

a first differential pair to which a first input signal or signals is/are input as a differential input;

a second differential pair to which a second input signal or signals is/are input as a differential input;

a load circuit;

a first to N-th (N is a positive integer larger than one) current sources; and

a first to N-th switch pairs, each having a pair of switches;

wherein output pair of each of said first and second differential pairs are commonly connected to each other at one end and are connected at the other end to said load circuit, at least one of said commonly connected output pairs being connected to an output terminal or terminals;

the switches on one side of said first to N-th switch pairs are connected at one end thereof to said first to N-th current sources, respectively, and are commonly connected at the other end thereof to said first differential pair;

the switches on the other side of said first to N-th switch pairs are connected at one end thereof to said first to N-th current sources, respectively, and are commonly connected at the other end thereof to said second differential pair; and

2N control signals having values which can be individually presettable are supplied to control terminals of said first to N-th switch pairs.

3. A semiconductor device as defined in claim 2 wherein operation of at least one among said current sources, said first and second differential pairs and said first to N-th switch pairs to be tested can be confirmed during testing by a functional test in which it is determined whether or not at least one output signal from said output terminal or terminals matches or match with expected value or values.

4. A semiconductor device as defined in claim 2 wherein each switch pair of said first to N-th switch pairs is set by said control signals so that one switch is turned on while the other switch is turned off.

5. A semiconductor device as defined in claim 2 wherein a connection node with said load circuit and a common connection node of output pairs of said first and second differential pairs is/are both connected to a differential output terminal.

6. A semiconductor device as defined in claim 2 wherein an output signal having a phase which is obtained by proportionally dividing the phase difference between said first and second input signals at a proportional ratio which is defined by said control signals is output from said output terminal.

7. A semiconductor device wherein:

said device comprises:

a plurality of current sources which are controlled to turn on or off in response to input digital signals and have their outputs which are commonly connected to each other;

a resistor and switch element which are in series connected between said commonly connected outputs of said plurality of current sources and a first power source; and

a logical circuit to which a test control signal for controlling test/normal modes of operation and said input digital signal are input to control the turning-on or off of said switch; wherein

said commonly connected outputs of said plurality of current sources are connected to an output terminal;

on testing said logical circuit controls the turning-on or off of said switch element in response to a value of said input digital signal to output a signal having a logical level as an output signal, so that operation of said current sources can be confirmed by a functional test.

8. A semiconductor device as defined in claim 7 wherein each of said plurality of current sources comprises a serial circuit of a switch which is turned on or off in response to said input digital signal and a constant current sources between said output terminal and a second power supply.

9. A semiconductor device as defined in claim 7 wherein in normal operation, said logical circuit turns said switch on, so that a signal having a level corresponding to said input digital signal is output from said output terminal.

10. A method of testing a semiconductor device comprising:

(a) providing a semiconductor device which comprises:

a first differential pair to which a first input signal or signals is/are input as a differential input;

a second differential pair to which a second input signal or signals is/are input as a differential input;

a load circuit;

a first to N-th (N is a positive integer larger than one) current sources; and

a first to N-th switch pairs, each having a pair of switches;

wherein output pair of each of said first and second differential pairs are commonly connected to each other at one end and are connected at the other end to said load circuit, at least one of said commonly connected output pairs being connected to an output terminal or terminals;

the switches on one side of said first to N-th switch pairs are connected at one end thereof to said first to N-th current sources, respectively, and are commonly connected at the other end thereof to said first differential pair;

the switches on the other side of said first to N-th switch pairs are connected at one end thereof to said first to N-th current sources, respectively, and are commonly connected at the other end thereof to said second differential pair; and

2N control signals having values which can be individually presettable are supplied to control terminals of said first to N-th switch pairs;

(b) a functional test step at which an application pattern is applied to control terminals of said first to N-th switch pairs from a test device on test by said 2N control signals, to determine whether the output signals from said output terminals match with expected value or values; and

(c) confirming operation of at least one of said current sources, said first and second differential pairs and said first to N-th switch pairs to be tested by the functional test.