Polishing method
View Patent ↗A polishing technique wherein scratches, peeling, dishing and erosion are suppressed, a complex cleaning process and slurry supply/processing equipment are not required, and the cost of consumable items such as slurries and polishing pads is reduced. A metal film formed on an insulating film comprising a groove is polished with a polishing solution containing an oxidizer and a substance which renders oxides water-soluble, but not containing a polishing abrasive.
1. A polishing method comprising:
chemically mechanically polishing a metal film using a polishing solution which additionally has included therein less than 1 wt % of a polishing abrasive, said solution having a pH and oxidation-reduction potential in the domain of corrosion of said metal film, said solution including a surfactant, wherein the surfactant is mechanically rubbed out from a surface of the metal film and a metal oxide is made soluble to the solution having a pH and oxidation-reduction potential in the domain of corrosion of said metal film.
2. A polishing method according to claim 1 , wherein said polishing solution has included therein less than 0.5 wt % of said polishing abrasive.
3. A polishing method according to claim 1 , wherein said polishing solution is substantially free of said polishing abrasive.
4. A polishing method according to claim 1 , wherein said surfactant is polyammoniumacrylate.
5. A polishing method according to claim 1 , wherein said metal film is one selected from the group consisting of a copper film, a copper alloy film, and a copper compound film having copper as its principal component.
6. A polishing method for removing at least part of a metal film on an insulating film, comprising:
chemically mechanically polishing the metal film using a polishing solution which additionally has included therein less than 1 wt % of a polishing abrasive, and includes an oxidizer, a substance which renders a metal oxide water-soluble, and a surfactant, said solution having a pH and oxidation-reduction potential in the domain of corrosion of said metal film, wherein the surfactant is mechanically rubbed out from a surface of the metal film and a metal oxide is made soluble to the substance for polishing the metal film.
7. A polishing method according to claim 6 , wherein said polishing solution has included therein less than 0.5 wt % of said polishing abrasive.
8. A polishing method according to claim 6 , wherein said polishing solution is substantially free of said polishing abrasive.
9. A polishing method according to claim 6 , wherein said surfactant is polyammoniumacrylate.
10. A polishing method according to claim 6 , wherein said metal film is one selected from the group consisting of a copper film, a copper alloy film, and a copper compound film having copper as its principal component.
11. A polishing method according to claim 6 , wherein said metal film is one selected from the group consisting of a tungsten film, a tungsten alloy film, and a tungsten compound film having tungsten as its principal component.
12. A polishing method for removing at least part of a metal film on an insulating film, comprising:
chemically mechanically polishing the metal film using a polishing solution which additionally has included therein less than 1 wt % of a polishing abrasive, and includes an oxidizer and malic acid, said solution, having a pH and oxidation-reduction potential in the domain of corrosion of said metal film, wherein the metal oxide is made soluble to the malic acid for polishing the metal film.
13. A polishing method according to claim 12 , wherein said polishing solution has included therein less than 0.5 wt % of said polishing abrasive.
14. A polishing method according to claim 12 , wherein said polishing solution is substantially free of said polishing abrasive.
15. A polishing method for removing at least part of a metal film on an insulating film, comprising:
chemically mechanically polishing the metal film using a polishing solution which additionally has included therein less than 1 wt % of a polishing abrasive and includes an oxidizer, malic acid, and a surfactant, said solution having a pH and oxidation-reduction potential in the domain of corrosion of said metal film, wherein the surfactant is mechanically rubbed out from a surface of the metal film and a metal oxide is made soluble to the malic acid for polishing the metal film.
16. A method for manufacturing a semiconductor device, comprising:
providing a substrate which includes a semiconductor;
forming an insulating film on said substrate, said insulating film having an opening;
forming a metal film inside said opening and overlying said insulating film; and
polishing said metal film by chemical mechanical polishing using a polishing solution which additionally has included therein less than 1 wt % of a polishing abrasive, said solution having a pH and oxidation-reduction potential in the domain of corrosion of said metal film, said polishing solution including an oxidizer, a substance which renders a metal oxide water-soluble and a surfactant, wherein the surfactant is mechanically rubbed out from a surface of the metal film, and a metal oxide is made soluble to the substance for polishing the metal film.
17. A method for manufacturing a semiconductor device according to claim 16 , wherein said polishing solution has included therein less than 0.5 wt % of said polishing abrasive.
18. A method for manufacturing a semiconductor device according to claim 16 , wherein said polishing solution is substantially free of said polishing abrasive.
19. A method for manufacturing a semiconductor device according to claim 16 , wherein said surfactant is polyammoniumacrylate.
20. A method for manufacturing a semiconductor device according to claim 16 , wherein said metal film is one selected from the group consisting of a copper film, a copper alloy film, and a copper compound film having copper as its principal component.
21. A method for manufacturing a semiconductor device according to claim 16 , wherein said metal film is one selected from the group consisting of a tungsten film, a tungsten alloy film, and a tungsten compound film having tungsten as its principal component.
22. A method for manufacturing a semiconductor device according to claim 16 , further comprising:
cleaning said substrate after the step of polishing said metal film, to provide a cleaned substrate, and drying said cleaned substrate.
23. A method for manufacturing a semiconductor device, comprising:
providing a substrate which includes a semiconductor;
forming an insulating film on said substrate, said insulating film having an opening;
forming a metal film inside said opening and overlying said insulating film; and
polishing said metal film by chemical mechanical polishing using a polishing solution which additionally has included therein less than 1 wt % of a polishing abrasive, and includes malic acid, and a surfactant, said solution having a pH and oxidation-reduction potential in the domain of corrosion of said metal film, wherein the surfactant is mechanically rubbed out from a surface of said metal film and a metal oxide is made soluble to the malic acid for polishing the metal film.
24. A method for manufacturing a semiconductor device according to claim 23 , wherein said polishing solution includes an oxidizer.
25. A method for manufacturing a semiconductor device according to claim 23 , wherein said polishing solution has included therein less than 0.5 wt % of said polishing abrasive.
26. A method for manufacturing a semiconductor device according to claim 23 , wherein said polishing solution is substantially free of said polishing abrasive.
27. A method of manufacturing semiconductor devices, comprising:
preparing a substrate having an impurity-doped layer;
forming an insulating film having an opening exposing said impurity-doped layer;
forming a layered film comprising a metal film having titanium nitride and copper as its principal components on the substrate on which said insulating film is formed;
mechanically rubbing a substance which suppresses etching or oxidation on said layered film surface by using a polishing solution comprising less than 0.01 wt % of an alumina polishing abrasive, hydrogen peroxide, citric acid or malic acid and a substance which suppresses etching or oxidation, said solution having a pH and oxidation-reduction potential in the domain of corrosion of said layered film.