Patent Assignment
Reel/Frame 020098/0527
Assignment of Assignor's Interest
Recorded: 2007-11-06
Pages: 3
Assignor
HITACHI, LTD.
Executed: 2007-10-25
Assignee
RENESAS TECHNOLOGY CORP.
6-2, OTEMACHI 2-CHOME, CHIYODA-KU, TOKYO, JAPAN
Covered Properties
(51)
Plasma Processing Apparatus
Patent:
4,776,918 →
Application:
07/110,368 →
Disk Drive Control Unit Having Sets of Operating Command and Operation Length Information and Generating End Signal Basesd Upon Operation Le Ngth Information
Patent:
5,109,500 →
Application:
07/113,606 →
Lead Frame and Semiconductor Device
Patent:
4,942,452 →
Application:
07/158,673 →
Apparatus for Selective Deposition of Metal Thin Film
Patent:
4,979,466 →
Application:
07/320,600 →
Method of Providing a Semiconductor Ic Device with an Additional Conduction Path
Patent:
5,026,664 →
Application:
07/334,145 →
Semiconductor Device and Method of Producing the Same
Patent:
5,181,087 →
Application:
07/340,471 →
Etching Method
Patent:
4,943,344 →
Application:
07/362,099 →
Transfer Molding Process and an Apparatus for the Same
Patent:
4,954,301 →
Application:
07/378,505 →
Method for Manufacturing Semiconductor Device
Patent:
5,219,765 →
Application:
07/549,069 →
Impurity Diffusion Method
Patent:
5,387,545 →
Application:
07/805,969 →
Inspection Data Analyzing System
Patent:
5,841,893 →
Application:
07/908,550 →
Semiconductor Device and Method of Producing the Same
Patent:
5,373,191 →
Application:
07/998,856 →
Semiconductor Device with Reinforcement
Patent:
5,440,171 →
Application:
08/027,478 →
Self-Timed Semiconductor Integrated Circuit Device
Patent:
5,612,640 →
Application:
08/308,303 →
Amplifier with a Function for Switching on and Off the Output Signal
Patent:
5,541,553 →
Application:
08/398,678 →
Self-Timed Semiconductor Integrated Circuit Device
Patent:
5,869,990 →
Application:
08/792,799 →
Semiconductor Logic Element and Apparatus Using Thereof
Patent:
6,097,036 →
Application:
08/913,189 →
An Inspection System and Method Using Separate Processors For Processing Different Information Regarding A Workpiece Such As An Electronic Device
Patent:
6,185,322 →
Application:
08/958,095 →
Semiconductor Device and Its Manufacture
Patent:
6,144,052 →
Application:
09/142,011 →
Semiconductor Device and Manufacturing Method Thereof Including a Probe Test Step and a Burn-in Test Step
Patent:
6,197,603 →
Application:
09/157,153 →
Self-Timed Semiconductor Integrated Circuit Device
Patent:
6,239,628 →
Application:
09/245,897 →
Method of Forming Bumps
Patent:
6,213,386 →
Application:
09/315,818 →
Inspection data analyzing system
Patent:
6,339,653 →
Application:
09/523,380 →
Inspection data analyzing system
Patent:
6,330,352 →
Application:
09/525,527 →
Pin Layout of Semiconductor Integrated Circuits Including Dul Band Amplifier and Receiving Mixer
Patent:
6,407,449 →
Application:
09/547,915 →
Semiconductor Device and Manufacturing Method Thereof Including a Probe Test Step and a Burn-in Test Step
Patent:
6,455,335 →
Application:
09/653,624 →
Method of Forming Bumps
Patent:
6,402,014 →
Application:
09/689,804 →
Inspection Data Analyzing System
Polishing Slurry
Inspection Data Analyzing System
Magnetic Semiconductor Memory Apparatus and Method of Manufacturing the Same
Process for Fabricating a Semiconductor Device
Method for Polishing a Semiconductor Substrate Member
Memory Controller
Field Effect Transistor
Semiconductor Memory Element, Semiconductor Device and Control Method Thereof
Pin Arrangement for High Frequency Integrated Circuit
Method of Forming Bumps
Semiconductor Device and Manufacturing Method Thereof Including a Probe Test Step and a Burn-in Test Step
Method for Manufacturing Semiconductor Device and Electronic Device and Method for Calculating Connection Condition
Semiconductor Device and Manufacturing Method Thereof Including a Probe Test Step and a Burn-in Test Step
Polishing Method
Method for Manufacturing Semiconductor Device and Apparatus for Manufacturing Thereof
Semiconductor Integrated Circuit
Semiconductor Integrated Circuit
Memory controller
Application:
10/824,504 →
Publication:
US 2004/0193779
Semiconductor Memory Element, Semiconductor Device and Control Method Thereof
Semiconductor Integrated Circuit
Method for Manufacturing Semiconductor Device and Apparatus for Manufacturing Thereof
Polishing Method
Polishing Method
Related Assignments
(21)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignors Interest.
Jan 5, 1988
From: YAMAGUCHI, YASUHIRO; TAKEUCHI, KINICHI, SUCCESSOR OF TAKAHIKO TAKEUCHI, DEC'D; OTSUBO, TORU
To: HITACHI, LTD.
Reel/Frame 004839/0337 →
Assignment of Assignors Interest.
Apr 6, 1989
From: HONGO, MIKIO; MIZUKOSHI, KATSURO; SANO, SHUZO; KAMIMURA, TAKASHI
To: HITACHI, LTD., 6, KANDA SURUGADAI 4-CHOME, CHIYODA-KU, TOKYO, JAPAN, A CORP. OF JAPAN
Reel/Frame 005061/0623 →
Assignment of Assignors Interest.
Feb 23, 1990
From: KITANO, MAKOTO; KAWAI, SUEO; NISHIMURA, ASAO; MIURA, HIDEO
To: HITACHI, LTD., A CORP. OF JAPAN
Reel/Frame 005232/0758 →
Assignment of Assignors Interest.
Apr 10, 1990
From: SAEKI, JUNICHI; KANEDA, AIZO; NISHI, KUNIHIKO
To: HITACHI, LTD.
Reel/Frame 005294/0546 →
Assignment of Assignors Interest.
Dec 12, 1991
From: KIYOTA, YUKIHIRO; NAKAMURA, TOHRU; ONAI, TAKAHIRO; INADA, TAROH
To: HITACHI, LTD., A CORPORATION OF JAPAN
Reel/Frame 005943/0658 →
Assignment of Assignors Interest.
Mar 23, 1992
From: YOSHIDA, TORU; SAKAGUCHI, SUGURU; KANEDA, AIZO; SERIZAWA, KOOJI
To: HITACHI, LTD.
Reel/Frame 006056/0718 →
Assignment of Assignor's Interest
Mar 20, 1995
From: MIYANO, ICHIRO; SERIZAWA, KOOJI; SAKAGUCHI, SUGURU; ISHIDA, TOSHIHARU
To: HITACHI, LTD.
Reel/Frame 007404/0416 →
Assignment of Assignor's Interest
Mar 11, 1996
From: CHUJO, NORIO; HAYASHI, YOSHIHIKO; OSAKI, AKIO
To: HITACHI, LTD
Reel/Frame 007850/0028 →
Assignment of Assignor's Interest
Oct 25, 1996
From: MURABAYASHI, FUMIO; YAMAUCHI, TATSUMI; KOBAYASHI, YUTAKA
To: HITACHI, LTD.
Reel/Frame 008193/0299 →
Assignment of Assignor's Interest
Sep 8, 1997
From: TESHIMA, TATSUYA; MIZUTA, HIROSHI; YAMAGUCHI, KEN
To: HITACHI, LTD.
Reel/Frame 008827/0404 →
Assignment of Assignor's Interest
Aug 31, 1998
From: KUSHIDA, KEIKO; HIRATANI, MASAHIKO; TORII, KAZUYOSHI; TAKATANI, SHINICHIRO
To: HITACHI LTD
Reel/Frame 009594/0521 →
Assignment of Assignor's Interest
Sep 18, 1998
From: KOHNO, RYUJI; KUMAZAWA, TETSUO; KITANO, MAKOTO; ARIGA, AKIHIKO
To: HITACHI LTD
Reel/Frame 009476/0340 →
Assignment of Assignor's Interest
May 21, 1999
From: INOUE, KOSUKE; NISHIMURA, ASAO; SUZUKI, TAKAMICHI; FUJII, TERU
To: HITACHI, LTD.
Reel/Frame 009998/0753 →
Assignment of Assignor's Interest
Apr 11, 2000
From: TAKIKAWA, KUMIKO; TANAKA, SATOSHI; HASHIMOTO, TAKASHI; OKABE, YOSHIYUKI
To: HITACHI, LTD
Reel/Frame 010715/0969 →
Assignment of Assignor's Interest
May 17, 2004
From: HOUSTON ECONOMIC OPPORTUNITY FUND II, L.P.
To: UNIPAL INTERNATIONAL CORPORATION
Reel/Frame 015328/0820 →
Assignment of Assignor's Interest
Aug 14, 2007
From: TAURUS INTERNATIONAL S.A.
To: MONDI TECHNOLOGY INVESTMENTS S.A.
Reel/Frame 019690/0293 →
Assignment of Assignor's Interest
Mar 30, 2010
From: MONDI TECHNOLOGY INVESTMENTS S.A.
To: UNIPAL INTERNATIONAL,LTD. CO.
Reel/Frame 024160/0290 →
Merger
Jul 30, 2010
From: RENESAS TECHNOLOGY CORP.
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025204/0512 →
Merger
Sep 20, 2010
From: RENESAS TECHNOLOGY CORP.
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025008/0362 →
Merger
Sep 23, 2010
From: RENESAS TECHNOLOGY CORP.
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025026/0625 →
Merger/Change of Name
Aug 31, 2011
From: RENESAS TECHNOLOGY CORP.
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 026837/0505 →