Patent Assignment
Reel/Frame 009476/0340
Assignment of Assignor's Interest
Recorded: 1998-09-18
Pages: 3
Assignors
KOHNO, RYUJI
Executed: 1998-09-03
KUMAZAWA, TETSUO
Executed: 1998-09-07
KITANO, MAKOTO
Executed: 1998-09-07
ARIGA, AKIHIKO
Executed: 1998-09-07
WADA, YUJI
Executed: 1998-09-07
BAN, NAOTO
Executed: 1998-09-07
SHIBUYA, SHUJI
Executed: 1998-08-19
MOTOYAMA, YASUHIRO
Executed: 1998-09-07
MATSUMOTO, KUNIO
Executed: 1998-09-07
KASUKABE, SUSUMU
Executed: 1998-09-07
MORI, TERUTAKA
Executed: 1998-08-20
SHIGI, HIDETAKA
Executed: 1998-09-07
WATANABE, TAKAYOSHI
Executed: 1998-08-19
Assignee
HITACHI LTD
CHIYODA-KU, 6, KANDA SURUGADAI 4-CHOME, TOKYO, JAPAN
Covered Property
(1)
Semiconductor Device and Manufacturing Method Thereof Including a Probe Test Step and a Burn-in Test Step
Patent:
6,197,603 →
Application:
09/157,153 →
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.