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App. No. 10/171,695 · Confirmation No. 1947

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF INCLUDING A PROBE TEST STEP AND A BURN-IN TEST STEP

Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362 View Patent ↗ View Publication ↗
⬇ PDF
 Code Description Pages PDF
2002-06-17 TRNA Transmittal of New Application 2 View
2002-06-17 A.PE Preliminary Amendment 3 View
2002-06-17 SPEC Specification 40 View
2002-06-17 CLM Claims 2 View
2002-06-17 ABST Abstract 1 View
2002-06-17 DRW Drawings-only black and white line drawings 16 View
2002-06-17 OATH Oath or Declaration filed 3 View
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Quick Facts
App. No.
10/171,695
Filed
2002-06-17
Granted
2003-05-20
Pub. No.
US20020182796A1
Art Unit
2812
PTA
0 days