Detection and correction of defects in semiconductor memories
View Patent ↗A non-volatile memory may have memory portions, such as blocks or other granularities of units of memory, which may fail in actual use. These defective portions can be replaced with other portions which may, in some cases, be of corresponding size. In some embodiments, defects may be detected using a current sensor which detects the current drawn in actual operation. If an excessive current is drawn, this may be detected, the defective unit deactivated, and a replacement provided in its stead. This may result in the repair of a defect with little inconvenience to the user in some embodiments.
1. A method comprising:
providing a control voltage to the gate of a transistor that supplies current to the defective portion of a non-volatile memory;
detecting a defective portion of a non-volatile memory in normal operation by using an operational amplifier to determine the voltage of a node coupled to the portion and using a second operational amplifier coupled to the output of the first operational amplifier to measure the current of the defective portion of the non-volatile memory in normal operation; and
in response to said detection, replacing the defective portion with a redundant memory portion.
2. The method of claim 1 wherein detecting includes monitoring the current drawn by the defective portion.
3. The method of claim 1 including using a reference device to establish a reference voltage.
4. The method of claim 1 including using as a reference device, a group of functional memory cells corresponding to the portion of the non-volatile memory being detected.
5. The method of claim 1 including using a PMOS transistor to supply current to a device under test.
6. A memory comprising:
a memory array;
a current sensor coupled to said array to detect when a portion of said array is defective in normal use, said sensor including a first operational amplifier to determine voltage of a node coupled to the portion and a second operational amplifier coupled to the first operational amplifier to measure the current of the portion in normal operation; and
a controller coupled to said current sensor to replace a defective portion of said array with a redundant portion of said array.
7. The memory of claim 6 wherein said memory is a flash memory.
8. The memory of claim 6 wherein said sensor uses negative feedback.
9. The memory of claim 8 , said sensor including a PMOS transistor coupled to said array.
10. The memory of claim 9 wherein said sensor includes a first operational amplifier and the PMOS transistor includes a gate coupled to said first operational amplifier, said first operational amplifier to compare an input voltage to a test voltage.
11. The memory of claim 10 wherein said input voltage is a voltage at the drain of said PMOS transistor.
12. The memory of claim 11 wherein said drain is coupled to said first operational amplifier and to said portion of said array.
13. The memory of claim 12 wherein the output of said first operational amplifier is compared to a reference voltage to determine whether a portion of the memory array is drawing excessive current.
14. The memory of claim 13 including a second operational amplifier to compare the output from said first operational amplifier to a reference voltage.
15. The memory of claim 14 wherein said reference voltage is determined using a constant current source.
16. The memory of claim 14 wherein said reference voltage is determined using a reference array portion.