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App. No. 11/615,819 · Confirmation No. 1516

UNIFORM SEEDING TO CONTROL GRAIN AND DEFECT DENSITY OF CRYSTALLIZED SILICON FOR USE IN SUB-MICRON THIN FILM TRANSISTORS

Abandoned -- Failure to Respond to an Office Action View Publication ↗
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 Code Description Pages PDF
2009-04-14 ABN Abandonment 2 View
2009-02-03 EBCC.AD Notice of Change of Address Place in File Wrapper Due to Electronic Business Center(EBC) Customer Number Update 1 View
2008-09-30 CTNF Non-Final Rejection 13 View
2008-09-30 892 List of references cited by examiner 1 View
2008-09-30 FWCLM Index of Claims 1 View
2008-09-30 SRFW Search information including classification, databases and other search related notes 1 View
2008-09-30 SRNT Examiner's search strategy and results 5 View
2008-09-12 SRNT Examiner's search strategy and results 1 View
2007-08-22 N570 Communication - Re: Power of Attorney (PTOL-308) 1 View
2007-08-09 PA.. Power of Attorney 2 View
2007-05-10 NTC.PUB Notice of Publication 1 View
2007-01-29 APP.FILE.REC Filing Receipt 3 View
2006-12-22 DRW Drawings-only black and white line drawings 5 View
2006-12-22 ADS Application Data Sheet 4 View
2006-12-22 SPEC Specification 20 View
2006-12-22 CLM Claims 1 View
2006-12-22 ABST Abstract 1 View
2006-12-22 OATH Oath or Declaration filed 2 View
2006-12-22 WFEE Fee Worksheet (SB06) 2 View
2006-12-22 N417 Electronic Filing System Acknowledgment Receipt 3 View
2006-12-22 WFEE Fee Worksheet (SB06) 1 View
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Quick Facts
App. No.
11/615,819
Filed
2006-12-22
Pub. No.
US20070105352A1
Art Unit
2895