Method for inspecting a grating biochip
View Patent ↗A method for inspecting a grating biochip comprises the steps of irradiating a grating biochip using a light beam, measuring a diffracted light using a photodetector, selecting a plurality of parameters of the grating biochip, and optimizing the parameters to enhance the detection sensitivity, wherein the diffracted light is generated by the light beam passing the grating biochip. The grating biochip comprises a grating structure including a semiconductor substrate, a grating positioned on the semiconductor substrate and a dielectric layer covering the grating and the semiconductor substrate. The sample of the biochip is positioned on the grating structure.
1. A method for inspecting a grating biochip, comprising:
irradiating a light beam having a predetermined wavelength to a grating biochip at a plurality of incident angles;
measuring a diffracted light by using a photodetector at a plurality of receiving angles to generate a measurement signal with a function of an incident angle of the light beam and structural parameters of the grating biochip, wherein the receiving angles of the photodetector change as the incident angles change, and the diffracted light is generated by the light beam passing the grating biochip;
selecting a plurality of parameters of the grating biochip; and
optimizing the parameters to enhance detection sensitivity.
2. The method for inspecting a grating biochip as claimed in claim 1 , wherein the light beam is generated by a focused laser source.
3. The method for inspecting a grating biochip as claimed in claim 1 , wherein the light beam is generated by a linear laser source.
4. The method for inspecting a grating biochip as claimed in claim 1 , wherein the light beam is generated by a planar laser source.
5. The method for inspecting a grating biochip as claimed in claim 1 , wherein the grating biochip comprises a grating structure including:
a semiconductor substrate;
a grating positioned on the semiconductor substrate; and
a dielectric layer covering the grating and the semiconductor substrate.
6. The method for inspecting a grating biochip as claimed in claim 5 , wherein the dielectric constant of the dielectric layer is higher than that of the grating.
7. The method for inspecting a grating biochip as claimed in claim 5 , wherein the grating biochip further comprises a single sample positioned on the grating structure.
8. The method for inspecting a grating biochip as claimed in claim 5 , wherein the grating biochip comprises a plurality of grating structures and samples arranged in a one-dimensional array.
9. The method for inspecting a grating biochip as claimed in claim 5 , wherein the grating biochip comprises a plurality of grating structures and samples arranged in a two-dimensional array.
10. The method for inspecting a grating biochip as claimed in claim 5 , wherein the grating is made of silicon-oxygen compound.
11. The method for inspecting a grating biochip as claimed in claim 5 , wherein the grating is made of silicon-nitrogen compound.
12. The method for inspecting a grating biochip as claimed in claim 5 , wherein the dielectric layer is made of silicon-nitrogen compound.
13. The method for inspecting a grating biochip as claimed in claim 5 , wherein the dielectric layer is made of poly-silicon material.
14. The method for inspecting a grating biochip as claimed in claim 1 , wherein the step of optimizing the parameters comprises:
determining a primary parameter and a plurality of subordinate parameters from the parameters;
using a rigorous coupled wave algorithm to find a first subordinate parameter combination enabling the grating biochip to have the first optimal sensitivity as the primary parameter is a first default value;
using the rigorous coupled wave algorithm to find a second subordinate parameter combination enabling the grating biochip to have a second optimal sensitivity as the primary parameter is a second default value; and
comparing the first optimal sensitivity with the second optimal sensitivity to determine an optimal subordinate parameter combination.
15. The method for inspecting a grating biochip as claimed in claim 14 , wherein the grating biochip includes a grating, and one of the parameters is the period of the grating.
16. The method for inspecting a grating biochip as claimed in claim 14 , wherein the grating biochip includes a grating, and one of the parameters is the line/space ratio of the grating.
17. The method for inspecting a grating biochip as claimed in claim 14 , wherein the grating biochip includes a grating, and one of the parameters is the thickness of the grating.
18. The method for inspecting a grating biochip as claimed in claim 14 , wherein the grating biochip includes a dielectric layer, and one of the parameters is the thickness of the dielectric layer.