IP Library Granted Patent US 7,889,587
Granted Patent B2
US 7,889,587 · App. 11/635,125 · Granted Feb 15, 2011

Fuse programming schemes for robust yield

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Quick Facts
Patent No.
US 7,889,587
App. No.
11/635,125
Granted
Feb 15, 2011
Kind
B2
Abstract

A program circuit generates first and second currents to program the fuse. The second current is higher than the first current. A control circuit controls generating the first and second currents in succession.

Claims (34)

1. An apparatus comprising:

a program circuit coupled to a fuse to generate first and second currents to program the fuse, the second current is higher than the first current; and

a control circuit coupled to the program circuit to control generating the first and second currents in succession.

2. The apparatus of claim 1 wherein the program circuit comprises:

one or more devices to generate the first and second currents.

3. An apparatus comprising:

a program circuit coupled to a fuse to generate first and second currents to program the fuse, the second current is higher than the first current, the program circuit comprising one or more devices to generate the first and second currents; and

a control circuit coupled to the program circuit to control generating the first and second currents in succession;

wherein the control circuit comprises:

a program enable generator coupled to the one or more devices to assert a program enable signal to the one or more devices a first time to generate the first current and a second time after the first time to generate the second current; and

a variable supply generator coupled to a fuse program terminal of the fuse to generate first and second fuse program voltages at first and second times, respectively, the second fuse program voltage being higher than the first fuse program voltage.

4. The apparatus of claim 3 wherein the program circuit comprises:

a first device to generate the first current; and

a second device to generate the second current.

5. The apparatus of claim 4 wherein the control circuit comprises:

a program enable generator coupled to the first and second devices to assert a first program enable signal to the first device before asserting a second program enable signal to the second device.

6. The apparatus of claim 3 wherein at least one of the first and second currents causes the fuse to be at a temperature within a program region.

7. A system comprising:

a front end processing unit to receive and transmit a radio frequency (RF) signal, the RF signal being converted to digital data;

a digital signal processor (DSP) coupled to the front end processing unit to process the digital data; and

a programmable logic device coupled to the DSP to perform logic functions, the DSP having a plurality of fuses and an in system programming (ISP) circuit, the ISP circuit comprising:

a program circuit coupled to a fuse to generate first and second currents to program the fuse, the second current is higher than the first current, and

a control circuit coupled to the program circuit to control generating the first and second currents in succession.

8. The system of claim 7 wherein the program circuit comprises:

a first device to generate the first current; and

a second device to generate the second current.

9. The system of claim 8 wherein the control circuit comprises:

a program enable generator coupled to the first and second devices to assert a first program enable signal to the first device before asserting a second program enable signal to the second device.

10. The system of claim 7 wherein the program circuit comprises:

one or more devices to generate the first and second currents.

11. The system of claim 10 wherein the control circuit comprises:

a program enable generator coupled to the one or more devices to assert a program enable signal to the one or more devices a first time to generate the first current and a second time after the first time to generate the second current; and

a variable supply generator coupled to a fuse program terminal of the fuse to generate first and second fuse program voltages at first and second times, respectively, the second fuse program voltage being higher than the first fuse program voltage.

12. The system of claim 7 wherein at least one of the first and second currents causes the fuse to be at a temperature within a program region.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 15, 2022
From: INTEL CORPORATION
To: TAHOE RESEARCH, LTD.
Reel/Frame 061175/0176 →