EUV light source
View Patent ↗An apparatus and method for EUV light production is disclosed which may comprise a laser produced plasma (“LPP”) extreme ultraviolet (“EUV”) light source comprising a target delivery system adapted to deliver moving plasma initiation targets and an EUV light collection optic having a focus defining a desired plasma initiation site.
1. An EUV light source apparatus comprising:
an optical input passage opening into an EUV plasma producing chamber;
an optical element within the optical input passage;
a debris mitigation mechanism intermediate the plasma producing chamber and the optical element preventing significant debris from reaching the optical element.
2. The apparatus of claim 1 further comprising:
the debris mitigation mechanism comprising:
a debris energizing mechanism intermediate the plasma producing chamber and the optical element energizing debris entering the input passage from the plasma producing chamber;
a debris steering mechanism intermediate the debris energizing mechanism and the optical element steering the energized debris away from the optical element.
3. The apparatus of claim 2 further comprising:
the debris energizing mechanism comprises a mechanism for introducing energy into the debris entering the input passage.
4. The apparatus of claim 3 further comprising:
the debris energizing mechanism is an RF energy inducer.
5. The apparatus of claim 4 further comprising:
the debris energizing mechanism comprising a steering field.
6. The apparatus of claim 5 further comprising:
the debris steering mechanism comprises a magnetic field.
7. The apparatus of claim 6 further comprising:
the optical element comprises:
a first focusing optic having a focal plane within the input passage;
a second focusing optic intermediate the first focusing optic and the plasma producing chamber;
a debris blocking place comprising an aperture positioned in the vicinity of the focal plane of the first focusing optic and functioning to block plasma initiation debris from reaching the first focusing optic.
8. The apparatus of claim 3 further comprising:
the optical element comprises:
a first focusing optic having a focal plane within the input passage;
a second focusing optic intermediate the first focusing optic and the plasma producing chamber;
a debris blocking plate comprising an aperture positioned in the vicinity of the focal plane of the first focusing optic and functioning to block plasma initiation debris from reaching the first focusing optic.
9. The apparatus of claim 4 further comprising:
the optical clement comprises:
a first focusing optic having a focal plane within the input passage;
a second focusing optic intermediate the first focusing optic and the plasma producing chamber;
a debris blocking plate comprising an aperture positioned in the vicinity of the focal plane of the first focusing optic and functioning to block plasma initiation debris from reaching the first focusing optic.
10. The apparatus of claim 5 further comprising:
the optical element comprises:
a first focusing optic having a focal plane within the input passage;
a second focusing optic intermediate the first focusing optic and the plasma producing chamber;
a debris blocking plate comprising an aperture positioned in the vicinity of the focal plane of the first focusing optic and functioning to block plasma initiation debris from reaching the first focusing optic.
11. The apparatus of claim 2 further comprising:
the debris energizing mechanism is an RF energy inducer.
12. The apparatus of claim 11 further comprising:
the debris energizing mechanism comprising a steering field.
13. The apparatus of claim 12 further comprising:
the debris steering mechanism comprises a magnetic field.
14. The apparatus of claim 13 further comprising:
the optical element comprises:
a first focusing optic having a focal plane within the input passage;
a second focusing optic intermediate the first focusing optic and the plasma producing chamber;
a debris blacking plate comprising an aperture positioned in the vicinity of the focal plane of the first focusing optic and functioning to block plasma initiation debris from reaching the first focusing optic.
15. The apparatus of claim 11 further comprising:
the optical element comprises:
a first focusing optic having a focal plane within the input passage;
a second focusing optic intermediate the first focusing optic and the plasma producing chamber;
a debris blocking plate comprising an aperture positioned in the vicinity of the focal plane of the first focusing optic and functioning to block plasma initiation debris from reaching the first focusing optic.
16. The apparatus of claim 12 further comprising:
the optical element comprises:
a first focusing optic having a focal plane within the input passage;
a second focusing optic intermediate the first focusing optic and the plasma producing chamber;
a debris blocking plate comprising an aperture positioned in the vicinity of the focal plane of the first focusing optic and functioning to block plasma initiation debris from reaching the first focusing optic.
17. The apparatus of claim 2 further comprising:
the optical clement comprises:
a first focusing optic having a focal plane within the input passage;
a second focusing optic intermediate the first focusing optic and the plasma producing chamber;
a debris blocking plate comprising an aperture positioned in the vicinity of the focal plane of the first focusing optic and functioning to block plasma initiation debris from reaching the first focusing optic.
18. The apparatus of claim 1 further comprising:
the optical element comprises:
a first focusing optic having a focal plane within the input passage;
a second focusing optic intermediate the first focusing optic and the plasma producing chamber;
a debris blocking plate comprising an aperture positioned in the vicinity of the focal plane of the first focusing optic and functioning to block plasma initiation debris from reaching the first focusing optic.
19. A method of operating an EUV light source comprising:
providing an optical input passage opening into an EUV plasma producing chamber;
utilizing an optical element within the optical input passage;
utilizing a debris mitigation mechanism intermediate the plasma producing chamber and the optical element, preventing significant debris from reaching the optical element.
20. The method of claim 19 further comprising:
the debris mitigation step comprising:
using a debris energizing mechanism intermediate the plasma producing chamber and the optical element, energizing debris entering the input passage from the plasma producing chamber;
using a debris steering mechanism intermediate the debris energizing mechanism and the optical element, steering the energized debris away from the optical element.
21. The method of claim 20 further comprising:
the debris energizing mechanism comprises a mechanism for introducing energy into the debris entering the input passage.
22. The method of claim 20 further comprising:
the debris energizing mechanism is an RF energy inducer.