Abnormality detection system and method of detecting abnormality
View Patent ↗An abnormality detection system includes a measurement unit, a decision unit, an alarm unit, and storage units, and serves to detect the abnormality in a control characteristic value of a plurality of products manufactured on the same production line. The decision unit receives the control characteristic value stored in the storage unit, and decides whether an abnormality exists, based on that value. More specifically, the decision unit decides that the control characteristic value is abnormal when, with respect to m (m is a natural number) pieces of the products that are consecutively manufactured, an absolute value of a difference in control characteristic value between each of the products and another manufactured immediately before the former is equal to or less than a predetermined constant.
1. An abnormality detection system comprising:
a measurement unit that measures different control characteristic values of a plurality of products manufactured on a same production line, said measurement unit being a non-image sensor;
a host computer that detects an abnormality in the measured control characteristic values arising from a malfunction in a connection between said measurement unit and said host computer, wherein said host computer executes centralized control of the production line,
the host computer comprising:
a storage unit that stores said control characteristic values measured with respect to said products and communicated on-line from said measurement unit; and
a decision unit that
a) acquires said control characteristic values from said storage unit,
b) decides whether a specific condition (i) is satisfied, the specific condition being, with respect to m pieces (m is a natural number) of said products that are consecutively manufactured, whether an absolute value of a difference in a respective one of said control characteristic values between each of said products and said product manufactured immediately before each of said products is equal to or less than a predetermined constant, and
c) decides that the respective one of said control characteristic values is abnormal due to a malfunction of the measurement unit or of a communication system that communicates said control characteristic values when said specific condition (i) is satisfied.
2. The abnormality detection system according to claim 1 , wherein said constant is zero.
3. A method of a host computer detecting an abnormality in control characteristic values of a plurality of products manufactured on a same production line, comprising:
measuring, with a measurement unit that is a non-image sensor, different control characteristic values of a plurality of products manufactured on a same production line;
said host computer executing centralized control of the production line;
storing in a storage unit in said host computer said control characteristic values measured with respect to said products and communicated on-line from said measurement unit;
acquiring said control characteristic values from said storage unit;
deciding whether a specific condition (i) is satisfied, the specific condition being, with respect to m pieces (m is a natural number) of said products that are consecutively manufactured, whether an absolute value of a difference in a respective one of said control characteristic values between each of said products and said product manufactured immediately before each of said products is equal to or less than a predetermined constant; and
deciding that the respective one of said control characteristic values is abnormal due to a malfunction arising from a malfunction in a connection between said measurement unit and said host computer when said specific condition (i) is satisfied.
4. The abnormality detection system according to claim 1 , further comprising:
an alarm unit that announces an occurrence of a malfunction of the measurement unit or of the communication system when said specific condition (i) is satisfied.
5. The method according to claim 3 , further comprising the step of announcing an occurrence of a malfunction of the measurement unit or of the communication system when said specific condition (i) is satisfied.
6. The abnormality detection system according to claim 1 , wherein said control characteristic values are measured on each of plural semiconductor device products on a semiconductor device production line.
7. The method according to claim 3 , wherein said control characteristic values are measured on each of plural semiconductor device products on a semiconductor device production line.