IP Library Granted Patent US 7,843,259
Granted Patent B2
US 7,843,259 · App. 11/658,224 · Granted Nov 30, 2010

Field effect transistor circuit and method of operation of field effect transistor circuit for reducing thermal runaway

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Quick Facts
Patent No.
US 7,843,259
App. No.
11/658,224
Granted
Nov 30, 2010
Kind
B2
Abstract

A field transistor is divided into a number of cells ( 6 ) and includes a separate first gate line ( 20 ) connected to first transistor cells ( 8 ) and a separate second gate line ( 22 ) connected to second transistor cells ( 10 ). A drive circuit is used to drive all the cells ( 6 ) in a normal, saturated operations state but to drive only the second cells ( 10 ) in a linear operations state to reduce the number of cells used in the linear operations state.

Claims (18)

1. A field effect transistor circuit, comprising;

a semiconductor substrate having a first major surface;

a plurality of transistor cells arranged across the substrate, each transistor cell including a FET having an insulated gate, a source and a drain;

wherein the transistor cells are divided into first cells and second cells, there being more first cells than second cells;

a first gate line connected to the first cells and a separate second gate line connected to the second cells; and

a means for driving the second gate line separately from the first gate line for turning on only the FETs of the second cells in a linear operation state.

2. A field effect transistor circuit according to claim 1 , wherein the transistor cells are parallel stripes, and the second cells are interdigitated with the first cells.

3. A field effect transistor circuit according to claim 2 , further comprising a gale pattern in which the first gate line extends laterally across the stripes and is connected to a plurality of first gate fingers extending longitudinally along the stripes to connect to the gates of the first cells and the second gate line extends laterally across the stripes and has a plurality of second gate fingers extending longitudinally along the stripes to connect to the gates of the second cells.

4. A field effect transistor circuit according to claim 3 wherein the second gate line extends along the middle of the gate pattern and wherein the first gate line extends around the periphery of the gate pattern.

5. A field effect transistor circuit according to claim 1 comprising a first gate pad connected to the first gate line and a separate second gate pad connected to the second gate line.

6. A field effect transistor circuit according to claim 1 , wherein the second cells are substantially evenly distributed over the first major surface.

7. A field effect transistor circuit according to claim 1 , further comprising at least one circuit element arranged to drive the first and second gate lines to different voltages in a linear operation state to switch the second cells and not the first cells on in the linear operation state.

8. A field effect transistor circuit according to claim 7 , wherein the at least one circuit element includes a voltage clamp circuit connected to the second gate line and hence to the gates of the second cells but not the first cells.

9. A field effect transistor circuit according to claim 8 , wherein the voltage clamp circuit is connected between the second gate line and the drain of the transistors included in the second cells.

10. A field effect transistor circuit according to claim 1 , wherein the number of second cells is from 1% to 50% of the total number of cells.

11. A method of operation of a field effect transistor circuit including a semiconductor substrate defining a first major surface; a plurality of transistor cells arranged across the substrate, each transistor cell including a FET having an insulated gate, a source and a drain wherein the cells are divided into first cells and second cells, there being more first cells than second cells, the method including:

driving the field effect transistor circuit in a saturated operation state by driving all of the gates of all of the FETs to switch the transistor cells on; and

driving the field effect transistor circuit in a linear operation state in which the FETs of the transistor cells are not fully turned on, by driving the second cells to be in a linear operation condition but leaving the first cells turned off.

Assignments (13)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
RELEASE OF SECURITY INTEREST Recorded Feb 13, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 048328/0964 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042762/0145 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 8, 2016
From: NXP B.V.
To: NEXPERIA B.V.
Reel/Frame 039610/0734 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12092129 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Jul 14, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039361/0212 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 2, 2016
From: CUTTER, JOHN R.
To: KONINKLIJKE PHILIPS ELECTRONICS N.V.
Reel/Frame 038439/0638 →
SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038017/0058 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 17, 2007
From: KONINKLIJKE PHILIPS ELECTRONICS N.V.
To: NXP B.V.
Reel/Frame 019719/0843 →