Method for evaluating the quality of a computer program
View Patent ↗The invention relates to a method for rating the quality of a computer program whose execution involves an integrated circuit's input data and output data being influenced, comprising (a) provision of a mutated integrated circuit which is obtained by incorporating one or more functional mutations into the (unmutated) integrated circuit; (b) influencing of the mutated integrated circuit's input data and output data, with the output data from the mutated integrated circuit being recorded; (c) comparison of the output data obtained in this manner from the mutated integrated circuit with the output data which the computer program expects when the unmutated integrated circuit is influenced; and (d) rating of the quality of the computer program on the basis of the comparison results.
1. A method for rating the quality of a computer program whose execution involves an integrated circuit's input data and output data being influenced, comprising:
generating a mutated integrated circuit by incorporating a plurality of functional mutations into an unmutated integrated circuit, wherein the mutated integrated circuit is implemented using one or more field programmable gate arrays (FPGA);
recording first output data generated from the mutated integrated circuit having received input data;
comparing, using a computer, the first output data with second output data generated from the unmutated integrated circuit having received the input data; and
determining a quality of the computer program based on the comparison,
wherein one of the plurality of incorporated functional mutations is active while the remaining plurality of incorporated functional mutations are inactive,
wherein the recording, the comparing, and the determining are repeated until each of the plurality of incorporated functional mutations has been active, and
wherein the quality of the computer program is based on a total number of incorporated functional mutations that are identified from the repeated comparison of the first output data with the second output data in relation to the number of the plurality of incorporated functional mutations.
2. The method as claimed in claim 1 , wherein the computer program is a test program for an integrated circuit or the design of an integrated circuit.
3. The method as claimed in claim 1 , wherein the first output data is formed in the computer program.
4. The method as claimed in claim 1 , wherein the second output data is obtained by the computer program when the unmutated integrated circuit receives the input data.
5. The method as claimed in claim 4 , wherein the first output data and the second output are obtained in parallel.
6. The method as claimed in claim 1 , wherein the quality of the program is determined as poor if no incorporated functional mutations are identified, or the number of incorporated functional mutations identified is lower than the number of the plurality of incorporated functional mutations.
7. The method as claimed in claim 1 , wherein the quality of the program is determined as good if the plurality of incorporated functional mutations are identified.
8. The method as claimed in claim 1 , wherein the computer program is a test program for an integrated circuit or a design of an integrated circuit.