IP Library Granted Patent US 7,498,611
Granted Patent B2
US 7,498,611 · App. 11/659,360 · Granted Mar 3, 2009

Transparent electrode for semiconductor light-emitting device

Assignee: Showa Denko K.K.
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Quick Facts
Patent No.
US 7,498,611
App. No.
11/659,360
Granted
Mar 3, 2009
Kind
B2
Abstract

A transparent electrode for a gallium nitride-based compound semiconductor light-emitting device includes a p-type semiconductor layer ( 5 ), a contact metal layer ( 1 ) formed by ohmic contact on the p-type semiconductor layer, an current diffusion layer ( 12 ) formed on the contact metal layer and having a lower magnitude of resistivity on the plane of the transparent electrode than the contact metal, and a bonding pad ( 13 ) formed on the current diffusion layer. The transparent electrode is at an advantage in widening the surface of light emission in the p-type semiconductor layer, decreasing the operation voltage in the forward direction, and enabling the bonding pad to provide excellent adhesive strength.

Claims (20)

1. A transparent electrode for a gallium nitride-based compound semiconductor light-emitting device having a p-type semiconductor layer, wherein the transparent electrode comprises a contact metal layer formed by ohmic contact on the p-type semiconductor layer, a current diffusion layer formed on the contact metal layer and having a lower magnitude of resistivity on a plane of the transparent electrode than the contact metal, and a bonding pad formed on the current diffusion layer; wherein the transparent electrode contains a layer of an electroconductive oxide; and wherein the contact metal layer is formed of a platinum group metal.

2. A transparent electrode according to claim 1 , wherein the bonding pad has an area of 90% or more held in direct contact with the current diffusion layer.

3. A transparent electrode according to claim 1 , wherein the bonding pad has an area of direct contact with the p-type semiconductor layer that is 10% or less.

4. A transparent electrode according to claim 1 , wherein the bonding pad avoids direct contact with the p-type semiconductor layer.

5. A transparent electrode according to claim 1 , wherein the current diffusion layer has an uppermost layer covered with a metal layer formed of tin and/or indium.

6. A transparent electrode according to claim 1 , wherein the contact metal layer is formed of platinum.

7. A transparent electrode according to claim 1 , wherein the contact metal layer has a thickness in a range of 0.1 to 7.5 nm.

8. A transparent electrode according to claim 1 , wherein the contact metal layer has a thickness of 5 nm or less.

9. A transparent electrode according to claim 1 , wherein the contact metal layer has a thickness in a range of 0.5 to 2.5 nm.

10. A transparent electrode according to claim 1 , wherein the current diffusion layer is formed of a metal selected from the group consisting of gold, silver and copper or an alloy containing at least one of these.

11. A transparent electrode according to claim 1 , wherein the current diffusion layer is formed of gold.

12. A transparent electrode according to claim 1 , wherein the current diffusion layer has a thickness in a range of 1 to 20 nm.

13. A transparent electrode according to claim 1 , wherein the current diffusion layer has a thickness of 10 nm or less.

14. A transparent electrode according to claim 1 , wherein the current diffusion layer has a thickness in a range of 3 to 6 nm.

15. A transparent electrode according to claim 1 , wherein the bonding pad contains a first layer contacting the current diffusion layer, and the first layer is formed of at least one metal selected from the group consisting of Ti, Al, Au, and Cr or an alloy thereof.

16. A transparent electrode according to claim 15 , wherein the first layer of the bonding pad has a thickness in a range of 20 to 3000 nm.

17. A transparent electrode according to claim 15 , wherein the bonding pad contains a second layer formed on the first layer of the bonding pad, and the second layer is formed of at least one metal selected from Ti and Cr or an alloy thereof.

18. A transparent electrode according to claim 17 , wherein the second layer of the bonding pad has a thickness in a range of 20 to 3000 nm.

19. A transparent electrode according to claim 1 , wherein the bonding pad has an uppermost layer formed of Au.

20. A light-emitting device using the transparent electrode set forth in claim 1 .

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 18, 2012
From: SHOWA DENKO KABUSHIKI KAISHA
To: TOYODA GOSEI CO., LTD.
Reel/Frame 029489/0249 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 23, 2007
From: EITOH, NOBUO; MURAKI, NORITAKA; MIKI, HISAYUKI; WATANABE, MUNETAKA
To: SHOWA DENKO K.K.
Reel/Frame 019409/0833 →
Priority Claims (1)
JP 2004-228968 · Aug 5, 2004 · national
Continuity (2)
Provisional Application 6060264800 · Aug 19, 2004
Related Publication 20080042159A1 · Feb 21, 2008