IP Library Granted Patent US 7,696,742
Granted Patent B2
US 7,696,742 · App. 11/664,110 · Granted Apr 13, 2010

Method and circuit for reducing noise when measuring intensity of electric current

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Quick Facts
Patent No.
US 7,696,742
App. No.
11/664,110
Granted
Apr 13, 2010
Kind
B2
Abstract

The measurement of a very low intensity of an electric current is carried out by 5 integrating the electric current over integration cycles having a time period ti and measuring a peak value of a sawtooth voltage at an integrated circuit output each time at the end of the integration cycle, whereat noise voltage components of a frequency above a cut-off frequency, which has a value of the order of magnitude (0,1×2π×ti) −1 , being parts of a voltage of a noise generated in an operational amplifier comprised in the integrated circuit are filtered out of the said sawtooth voltage and noise components, which have the origin in the high-frequency voltage components of Johnson noise, which appear in the low-frequency spectral part of the sawtooth voltage as aliasing, are subtracted from a filtered sawtooth voltage. A higher absolute accuracy of the measurement is achieved by means of a reduction of the direct as well as the aliasing contribution of the Johnson noise of the operational amplifier in the measuring circuit.

Claims (19)

1. A circuit for measuring intensity of an electric current by integrating the electric current over integration cycles having a time period ti, comprising;

a first operational amplifier (OPAMP) having first and second inputs and an output;

means for measuring a peak value of a sawtooth voltage at the output of the first operational amplifier at the end of the integration cycle;

a voltage adder having an addend input, a subtrahend input and an output;

a first low-pass filter with an upper cut-off frequency, which has a value of the order of magnitude (0,1×2π×ti) −1 , for connecting the output of the first OPAMP to the addend input of the voltage adder;

a second OPAMP having first and second inputs and an output;

a second low-pass filter having an input and an output, the input of the second low-pass filter connected to the output of the second OPAMP;

a first switch having an input and an output, the input of the switch connected to the output of the output of the second low-pass filter;

means for connecting the output of the first switch to the subtrahend input of the voltage adder and to a capacitor to provide a correction voltage from the output of the second OPAMP and a capacitor, whose one terminal is connected to mass and provided to store the correction voltage being stored in the capacitor;

means for connecting output of the voltage adder to the first input of the second OPAMP; and

the second OPAMP, the second low-pass filter, and the switch constituting a correction circuit, wherein the time constant of the correction circuit is approximately three times shorter than a time interval in which the switch remains closed.

2. The circuit provided for measuring intensity of an electric current as recited in claim 1 , wherein the first switch provided to renew the correction voltage is closed for a time interval between 0,01×ti and 0,02×ti at the beginning of each integration cycle.

3. The circuit provided for measuring intensity of an electric current as recited in claim 1 , further comprising: third and fourth switches, wherein the first low-pass filters has a first capacitor connected to the third switch and the second low-pass filter has a second capacitor connected to the fourth switch and the first capacitor in the first low-pass filter and the second capacitor in the second low-pass filter discharge through their respective switches at the end of each integration cycle.

4. The circuit of claim 1 further comprising an output sampling switch and means for connecting the output of the voltage adder and the first input of the second OPAMP to an output sampling switch.

5. A method for measuring intensity of an electric current in an integrated circuit with an operational amplifier (OPAMP) by integrating the electric current over integration cycles having a time period ti, the method comprising the steps of:

measuring a peak value of a sawtooth voltage at an output of the OPAMP at the end of each integration cycle;

filtering out the sawtooth voltage components of a frequency above a cut-off frequency, which has a value on the order of magnitude (0,1×2π×ti) −1 , the filtered sawtooth voltage components being parts of a voltage of a noise generated in the OPAMP;

measuring a mean value of a residual noise voltage in the filtered sawtooth voltage in a short time interval on the order of magnitude between 0,01×ti and 0,02×ti at the beginning of each integration cycle; and

subtracting the measured mean value of the residual noise voltage from the filtered sawtooth voltage.

Assignments (2)
CHANGE OF NAME Recorded Jan 29, 2014
From: IDS MICROCHIP AG
To: AMS INTERNATIONAL AG
Reel/Frame 032136/0929 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 7, 2013
From: KUNC, VINKO; ATANASIJEVIC-KUNC, MAJA; VODOPIVEC, ANDREJ
To: IDS MICROCHIP AG
Reel/Frame 029579/0609 →
Priority Claims (1)
SI P-200400272 · Sep 29, 2004 · national
Continuity (1)
Related Publication 20080284411A1 · Nov 20, 2008