IP Library Granted Patent US 8,157,158
Granted Patent B2
US 8,157,158 · App. 11/669,076 · Granted Apr 17, 2012

Modification of solder alloy compositions to suppress interfacial void formation in solder joints

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Quick Facts
Patent No.
US 8,157,158
App. No.
11/669,076
Granted
Apr 17, 2012
Kind
B2
Abstract

A solder joint comprising a solder capture pad on a substrate having a circuit; and a lead containing or a lead free solder selected from the group comprising Sn—Ag—Cu solder, Sn—Cu solder and Sn—Ag solder adhered to the solder capture pad; the solder selected from the group comprising between 0.1 and 6.0 per cent by weight Zn. A solder joint, comprising a solder capture pad on a substrate having a circuit; and a Sn—Cu lead free solder adhered to the solder capture pad, the solder comprising between 0.1 and 6.0% by weight Zn. Formation of voids at an interface between the solder and the solder capture pad is suppressed. A method for forming solder joints using the solders.

Claims (16)

1. A method for forming a solder joint on a solder capture pad of a substrate having a circuit, comprising:

applying to said capture pad a lead free solder, the lead free solder being selected from the group consisting of Sn—Ag—Cu solder, Sn—Cu solder and Sn—Ag solder; and

adhering said solder to said solder capture pad by melting and cooling said solder;

said solder containing between 0.1 and 6.0 percent by weight Zn, so that formation of voids at an interface between said solder and said solder capture pad is suppressed; Zn content of said solder being determined in accordance with a ratio of volume of said solder to surface area of said solder capture pad;

wherein the solder capture pad is comprised of plated Cu, further comprising annealing of the plated Cu pad at a temperature of approximately 550° C., prior to forming the solder joint.

2. The method of claim 1 , wherein said selected solder is Sn—Cu solder.

3. The method of claim 2 , wherein the solder further comprises 0.5% by weight Bi.

4. The method of claim 3 , wherein copper content of said solder is between 0.7 and 2.0% by weight Cu.

5. The method of claim 4 , wherein said solder is heated to a temperature of less than 280° C. to melt said solder.

6. The method of claim 4 , wherein said solder is heated to a temperature of between 217 and 280 degrees C. to melt said solder.

7. The method of claim 1 , wherein said selected solder is Sn—Ag solder.

8. The method of claim 1 , further comprising placing an organic solderability preservative on said solder capture pad prior to applying said solder to said pad.

9. The method of claim 1 , wherein at least substantially 4×10 −12 grams of Zn are present in said solder per square micron of solder capture pad surface area.

10. The method of claim 1 , wherein solder is Sn—Ag—Cu solder containing 0.7 percent by weight Zn and wherein the formation of Cu 3 Sn is retarded in its development on the solder capture pad.

11. The method of claim 1 , wherein the solder capture pad is comprised of Ni.

12. The method of claim 1 , wherein the Zn content of the solder is less than 0.6 percent by weight.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 12, 2014
From: INTERNATIONAL BUSINESS MACHINES CORPORATION
To: ULTRATECH, INC.
Reel/Frame 033519/0066 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 30, 2008
From: GRUBER, PETER A.; HENDERSON, DONALD W.; KANG, SUNG K.; SHIH, DA-YUAN
To: INTERNATIONAL BUSINESS MACHINES CORPORATION
Reel/Frame 020875/0816 →