Circuit for use in a multiple block memory
View Patent ↗A portion of a memory may include a first memory block, including a first memory cell coupled to a first memory data line, a second memory block, including a second memory cell coupled to a second memory data line, and a latch, having a first terminal and a second terminal. The portion of the memory may further include a first N-channel transistor, having a first current electrode coupled to the first terminal of the latch, having a second current electrode coupled to a first power supply voltage, and having a control electrode coupled to the first memory data line. The portion of the memory may further include a second N-channel transistor, having a first current electrode coupled to the first terminal of the latch, having a second current electrode coupled to the first power supply voltage, and having a control electrode coupled to the second memory data line.
1. A circuit portion, comprising:
a latch, having a first terminal and having a second terminal;
a first N-channel transistor, having a first current electrode, a second current electrode coupled to a power supply voltage, and a control electrode coupled to a first conductor of a first differential pair;
a second N-channel transistor, having a first current electrode coupled to the first current electrode of the first N-channel transistor and coupled to the first terminal of the latch, a second current electrode coupled to the power supply voltage, and a control electrode coupled to a first conductor of a second differential pair;
a third N-channel transistor, having a first current electrode, a second current electrode coupled to the power supply voltage, and a control electrode coupled to a second conductor of the first differential pair; and
a fourth N-channel transistor, having a first current electrode coupled to the first current electrode of the third N-channel transistor and coupled to the second terminal of the latch, a second current electrode coupled to the power supply voltage, and a control electrode coupled to a second conductor of the second differential pair.
2. A circuit portion as in claim 1 , wherein only one of the first transistor, the second transistor, the third transistor, and the fourth transistor is conducting at any time.
3. A circuit portion as in claim 1 , wherein the latch comprises cross-coupled inverters.
4. A circuit portion as in claim 1 , further comprising:
a first sense amplifier for providing the first differential pair; and
a second sense amplifier for providing the second differential pair.
5. A circuit portion as in claim 1 , wherein the circuit portion is formed as part of a static random access memory or a cache.
6. A circuit portion as in claim 5 , wherein the cache comprises a level two cache.
7. A circuit portion as in claim 5 , wherein the first differential pair is associated with a first cache way and the second differential pair is associated with a second cache way.
8. A circuit portion as in claim 7 , wherein the first cache way and the second cache way are not selected at a same time.
9. A circuit portion as in claim 1 , wherein the power supply voltage is approximately ground.
10. A memory, comprising:
a first memory block, comprising a first memory cell coupled to a first memory data line;
a second memory block, comprising a second memory cell coupled to a second memory data line;
a latch, having a first terminal and a second terminal;
a first N-channel transistor, having a first current electrode coupled to the first terminal of the latch, having a second current electrode coupled to a power supply voltage, and having a control electrode coupled to the first memory data line; and
a second N-channel transistor, having a first current electrode coupled to the first terminal of the latch, having a second current electrode coupled to the power supply voltage, and having a control electrode coupled to the second memory data line.
11. A memory as in claim 10 , wherein the first memory block further comprises a third memory data line and wherein the second memory block further comprises a fourth memory data line, and wherein the first memory data line and the third memory data line comprise a first differential pair, and wherein the second memory data line and the fourth memory data line comprise a second differential pair, the memory further comprising:
a third N-channel transistor, having a first current electrode coupled to the second terminal of the latch, having a second current electrode coupled to the power supply voltage, and having a control electrode coupled to the third memory data line; and
a fourth N-channel transistor, having a first current electrode coupled to the second terminal of the latch, having a second current electrode coupled to the power supply voltage, and having a control electrode coupled to the fourth memory data line.
12. A memory as in claim 11 , wherein only one of the first transistor, the second transistor, the third transistor, and the fourth transistor is conducting at any time.
13. A memory as in claim 10 , wherein the latch comprises cross-coupled inverters.
14. A memory as in claim 11 , further comprising:
a first sense amplifier for providing the first differential pair; and
a second sense amplifier for providing the second differential pair.
15. A memory as in claim 10 , wherein the memory comprises a static random access memory.
16. A memory as in claim 11 , wherein the memory is formed as part of a cache.
17. A memory as in claim 16 , wherein the cache comprises a level two cache.
18. A circuit portion as in claim 16 , wherein the first differential pair is associated with a first cache way and the second differential pair is associated with a second cache way.
19. A method for multiplexing in a memory, the method comprising:
providing a first memory block;
providing a second memory block;
providing a first pair of differential data outputs from the first memory block;
providing a second pair of differential data outputs from the second memory block; and
multiplexing the first pair of differential data outputs and the second pair of differential data outputs using a plurality of common-drain connected N-channel transistors to provide an output.
20. A method as in claim 19 , wherein no more than one of the plurality of common-drain connected N-channel transistors is conducting at any time.