Defect detection lighting system and methods for large glass sheets
A glass defect detection system comprising an apparatus and methods for the real-time inspection for defects in and on transparent sheets, such as a large sheets of glass is disclosed. The defect detection system utilizes a plurality of dark-field illumination systems and bright-field illumination systems and a plurality of baffles. A plurality of imaging devices are deployed to obtain images of transparent sheets. The defect detection system provides uniform lighting capable of equal detection of defects in all orientations and geometries. An image processing system analyzes for defects in and on the transparent sheet.
1. A glass defect detection system, for the inspection of a large optically transparent sheet for the purpose of detecting defects in and on the transparent sheet, comprising:
a plurality of illumination sources
for projecting light onto the transparent sheet where each of the plurality of illumination sources comprise: a dark-field light assembly comprising a cross-conveyor light assembly and a plurality of parallel-conveyor light assemblies;
a plurality of baffles;
a plurality of imaging devices
for receiving light reflected and scattered from the transparent sheet, providing an image of the transparent sheet and transmitting the image of the transparent sheet to an image processing system, and;
an image processing system
for analyzing the image for the defects in and on the transparent sheet.
2. The glass defect detection system, as in claim 1 , wherein each of the plurality of imaging devices has a field of view comprising a dark-field field of view, and each of the plurality of baffles is positioned relative to each of the plurality of imaging devices and the dark-field light assembly to prevent light from the dark-field light assembly from reflecting off the transparent sheet, such that a reflected image of each of the plurality of illumination sources does not appear in the field of view of each of the plurality of imaging devices.
3. The glass defect detection system, as in claim 1 , wherein each of the plurality of illumination sources produces a semi-collimated beam positioned at an angle beta to a normal of the transparent sheet, and a reflection of the semi-collimated beam from the transparent sheet is located outside a field of view of each of the plurality of imaging devices, and each of the plurality of imaging devices is positioned at an angle alpha to a normal of the transparent sheet and the difference in the angle alpha and the angle beta is less than forty-five degrees.
4. The angles alpha and beta, as in claim 3 , wherein the angles alpha and beta are less than thirty degrees from the normal of the transparent sheet.
5. The glass defect detection system, as in claim 1 , wherein each of the plurality of illumination sources and each of the plurality of imaging devices are on a same side of the transparent sheet.
6. The glass defect detection system, as in claim 1 , wherein the cross-conveyor light assembly and each of the plurality of parallel-conveyor light assemblies are linear arrays of LEDs.
7. A glass defect detection system, for the inspection of a large transparent sheet for the purpose of detecting defects in and on the transparent sheet, comprising:
a plurality of illumination sources
for projecting light onto the transparent sheet where each of the plurality of illumination sources comprise: a dark-field light assembly comprising a cross-conveyor light assembly and a plurality of parallel-conveyor light assemblies; and a bright-field light assembly;
a plurality of baffles;
a plurality of imaging devices
for receiving light reflected and scattered from the transparent sheet, providing an image of the transparent sheet and transmitting the image of the transparent sheet to an image processing system, where each of the plurality of imaging devices is an area scan camera, and;
an image processing system
for analyzing the image for the defects in and on the transparent sheet.
8. The glass defect detection system, as in claim 7 , wherein the camera has a field of view comprising a dark-field field of view and a bright-field field of view, and each of the plurality of baffles is positioned relative to each of the plurality of imaging devices and the dark-field light assembly to prevent light from the dark-field light assembly from reflecting off the transparent sheet, such that a reflected image of each of the plurality of illumination sources does not appear in the field of view of the camera.
9. The glass defect detection system, as in claim 7 , wherein the dark-field light assembly produces a semi-collimated beam positioned at an angle beta to a normal of the transparent sheet, and a reflection of the semi-collimated beam from the transparent sheet is located outside a field of view of the camera, and the camera is positioned at an angle alpha to a normal of the transparent sheet and a difference in the angle alpha and the angle beta is less than forty-five degrees.
10. The angles alpha and beta, as in claim 9 , wherein the angles alpha and beta are less than thirty degrees from the normal of the transparent sheet.
11. The glass defect detection system, as in claim 7 , wherein each of the plurality of illumination sources and the camera are on a same side of the transparent sheet.
12. The bright-field light assembly, as in claim 7 , wherein a reflection of light from the bright-field light assembly is detected by the camera in a bright-field field of view and can be used to determine a presence and a geometry of the transparent sheet.
13. The glass defect detection system, as in claim 7 , wherein the camera receives light from the bright-field light assembly and the dark-field light assembly simultaneously.
14. The glass defect detection system, as in claim 7 , wherein the cross-conveyor light assembly and each of the plurality of parallel-conveyor light assemblies are linear arrays of LEDs.
15. A method for the optical inspection of a large transparent sheet for the purpose of detecting defects in and on the large transparent sheet, comprising:
projecting light onto the transparent sheet from a plurality of illumination sources where each of the plurality of illumination sources comprise: a dark-field light assembly comprising a cross-conveyor light assembly and a plurality of parallel-conveyor light assemblies;
blocking light reflected from the transparent sheet with a plurality of baffles;
receiving light in an imaging device that provides an image of the transparent sheet and transmitting the image of the transparent sheet to an image processing system; and
analyzing the image for the defects with the image processing system.
16. The method in claim 15 , characterized in that receiving light in an imaging device includes receiving light from a dark-field field of view, and blocking light requires the positioning of baffles relative to the imaging device and the dark-field light assembly, so that a reflected image of each of the plurality of illumination sources does not appear in a field of view of the imaging device.
17. The method in claim 15 , characterized in that in projecting light, the dark-field light assembly produces a semi-collimated beam positioned at an angle beta to a normal of the transparent sheet, with a reflection of the semi-collimated beam from the transparent sheet located outside a field of view of the imaging device, with the imaging device positioned at an angle alpha to a normal of the transparent sheet and a difference in the angle alpha and the angle beta is less than forty-five degrees.
18. The method as in claim 17 , characterized in that the angle alpha and the angle beta are less than thirty degrees from the normal of the transparent sheet.
19. The method as in claim 15 , characterized in that projecting light and receiving light occur on a same side of the transparent sheet.
20. The method as in claim 15 , characterized in that projecting light further comprises projecting light with a bright-field light assembly.
21. The method as in claim 15 , characterized in that in projecting light the cross-conveyor light assembly and each of the plurality of parallel-conveyor light assemblies are linear arrays of LEDs.
22. The method as in claim 15 , characterized in that in receiving light, the imaging device is an area scan camera.