IP Library Granted Patent US 7,486,535
Granted Patent B2
US 7,486,535 · App. 11/692,332 · Granted Feb 3, 2009

Method and device for programming anti-fuses

Assignee: Freescale Semiconductor, Inc.
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Quick Facts
Patent No.
US 7,486,535
App. No.
11/692,332
Granted
Feb 3, 2009
Kind
B2
Abstract

A device includes an anti-fuse including a first electrode that can be selectively coupled to a first voltage reference and a second electrode that can be selectively coupled to a second voltage reference. The device further includes a shunt transistor including a first current electrode coupled to the first electrode of the anti-fuse, a second current electrode coupled to the second electrode of the anti-fuse, and a control electrode. The device additionally includes control logic configured to disable the shunt transistor in response to a first program operation intended for the anti-fuse. The control logic also is configured to enable the shunt transistor in response to a second program operation not intended for the anti-fuse.

Claims (46)

1. A method comprising:

disabling a first shunt transistor coupled in parallel with a first anti-fuse in response to initiation of a first program operation intended for the first anti-fuse;

enabling the first shunt transistor in response to initiation of a second program operation not intended for the first anti-fuse;

disabling a second shunt transistor coupled in parallel with a second anti-fuse in response to initiation of the second program operation, the second program operation intended for the second anti-fuse; and

enabling the second shunt transistor in response to initiation of the first program operation, the first program operation not intended for the second anti-fuse.

2. The method of claim 1 , wherein disabling the first shunt transistor comprises selectively disabling the first shunt transistor based on a proximity of the second anti-fuse to the first anti-fuse.

3. The method of claim 1 , further comprising:

disabling the first shunt transistor in response to initiation of a read operation for the first anti-fuse.

4. The method of claim 3 , further comprising:

determining, during the read operation, a fuse state of the first anti-fuse based on a voltage difference between electrodes of the first anti-fuse.

5. The method of claim 4 , further comprising:

controlling an operation of a component based on the fuse state.

6. The method of claim 1 , further comprising:

applying a program voltage to the first anti-fuse to program the first anti-fuse during the first program operation.

7. A device comprising:

a first anti-fuse comprising a first electrode coupleable to a first voltage reference and a second electrode coupleable to a second voltage reference;

a first shunt transistor comprising a first current electrode coupled to the first electrode of the first anti-fuse, a second current electrode coupled to the second electrode of the first anti-fuse, and a control electrode;

first control logic configured to disable the first shunt transistor in response to a first program operation intended for the first anti-fuse;

a second anti-fuse comprising a first electrode coupleable to the first voltage reference and a second electrode coupleable to the second voltage reference;

a second shunt transistor comprising a first current electrode coupled to the first electrode of the second anti-fuse, a second current electrode coupled to the second electrode of the second anti-fuse, and a control electrode; and

second control logic configured to enable the second shunt transistor in response to the first program operation.

8. The device of claim 7 , wherein the first control logic is configured to enable the first shunt transistor in response to a second program operation not intended for the first anti-fuse.

9. The device of claim 7 , wherein the first control logic is configured to disable the first shunt transistor in response to a read operation for the first anti-fuse.

10. The device of claim 9 , further comprising:

a fuse state module configured to determine a voltage difference between the first electrode and the second electrode of the first anti-fuse during the read operation.

11. The device of claim 10 , wherein the fuse state module comprises:

an output to provide a voltage representative of the voltage difference;

a first transistor comprising a first electrode coupled to the first voltage reference, a second electrode coupled to the output, and a control electrode to receive a first control signal, wherein the first transistor is enabled when the first control signal is in a first state and disabled when the first control signal is in a second state; and

a second transistor comprising a first electrode connected to the output, a second current electrode connected to the second voltage reference, and a control electrode to receive a second control signal, wherein the second control signal is an inverse of the first control signal and wherein the second transistor is enabled when the second control signal is in the first state and disabled when the second control signal is in the second state.

12. The device of claim 7 , wherein the second control logic is configured to disable the second shunt transistor in response to a second program operation intended for the second anti-fuse.

13. The device of claim 12 , wherein the first control logic is configured to enable the first shunt transistor in response to the second program operation.

14. A device comprising:

an array of anti-fuse cells, each anti-fuse cell comprising an anti-fuse and a shunt transistor coupled in parallel; and

a fuse control module configured to:

disable a first shunt transistor of a first anti-fuse cell of the array in response to a first program operation; and

enable a second shunt transistor of a second anti-fuse cell of the array in response to the first program operation, the first program operation intended for the first anti-fuse cell and not intended for the second anti-fuse cell.

15. The device of claim 14 , wherein the fuse control module is configured to:

disable the second shunt transistor in response to a second program operation; and

enable the first shunt transistor in response to the second program operation, the second program operation intended for the second anti-fuse cell and not intended for the first anti-fuse cell.

16. The device of claim 14 , wherein the fuse control module is configured to:

disable the first shunt transistor in response to a read operation for the anti-fuse of the first anti-fuse cell; and

disable the second shunt transistor in response to a read operation for the anti-fuse of the second anti-fuse cell.

17. The device of claim 14 , further comprising:

a fuse state module coupled to the first anti-fuse cell and configured to determine a fuse state of the anti-fuse of the first anti-fuse cell.

18. The device of claim 17 , further comprising:

an operational component coupled to the first anti-fuse cell and configurable based on the fuse state of the anti-fuse of the first anti-fuse cell.

Assignments (32)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042762/0145 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE LISTED CHANGE OF NAME SHOULD BE MERGER AND CHANGE PREVIOUSLY RECORDED AT REEL: 040652 FRAME: 0180. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Jan 12, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 041354/0148 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 040652/0180 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12092129 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Jul 14, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039361/0212 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
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To: MORGAN STANLEY SENIOR FUNDING, INC.
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0553 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
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PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
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PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
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SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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SECURITY AGREEMENT Recorded May 13, 2010
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 024397/0001 →
SECURITY AGREEMENT Recorded May 19, 2009
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A.
Reel/Frame 022703/0405 →
SECURITY AGREEMENT Recorded Sep 19, 2007
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A.
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ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 28, 2007
From: PERKINS, GEOFFREY W.
To: FREESCALE SEMICONDUCTOR, INC.
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Continuity (1)
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