Testing an electronic device using test data from a plurality of testers
View Patent ↗A method and apparatus for testing a set of electronic devices can comprise placing electronic devices into a test station. A plurality of testers can provide test data to the test station. The test station can test the electronic devices using test data received from the plurality of testers. One of the testers can communication with another of the testers regarding the testing of the electronic devices. Probes can be used to contact the electronic devices, and one of the electronic devices can be contacted by more than one of the probes.
1. A test system comprising:
a plurality of testers each configured to control testing of electronic devices, the plurality of testers comprising a first tester and a second tester;
a test station configured to test a set of the electronic devices in accordance with test data received from the plurality of testers; and
one or more communications links linking each of the testers to the test station, wherein:
the first tester is configured to control testing of the set of electronic devices at the test station in accordance with a first type of testing; and
the second tester is configured to control testing of the set of electronic devices at the test station in accordance with a second type of testing,
wherein the second type of testing is different than the first type of testing.
2. The test system of claim 1 , wherein the first tester and the second tester are configured to control sequential testing of the set of electronic devices such that the first type of testing and the second type of testing are performed sequentially.
3. A test system comprising:
a plurality of testers each configured to control testing of electronic devices, the plurality of testers comprising a first tester and a second tester;
a test station configured to test a set of the electronic devices in accordance with test data received from the plurality of testers; and
one or more communications links linking each of the testers to the test station, wherein:
the first tester is configured to control testing of the set of electronic devices at the test station in accordance with a first type of testing; and
the second tester is configured to control testing of the set of electronic devices at the test station in accordance with a second type of testing,
wherein the second type of testing is different than the first type of testing,
wherein the first tester is configured to signal the second tester after completion of the first type of testing of the set of electronic devices at the test station.
4. The test system of claim 3 , wherein the second tester is configured to start the second type of testing on the set of electronic devices at the test station after receiving the signal from the first tester that the first type of testing of the set of electronic devices at the test station is completed.
5. The test system of claim 4 , wherein the first tester is configured to start the first type of testing on the set of electronic devices at the test station after receiving a signal from the test station requesting testing of the electronic devices at the test station.