In-line process for making thin film electronic devices
An in-line process for making a thin film electronic device on a substrate is described comprising the steps of: a) depositing a structurable layer onto a substrate; b) depositing a patternable material onto the structurable layer in a first pattern; and c) etching the structurable layer in areas uncovered by the patternable material. The steps are carried out without intermediate exposure of the substrate to ambient air.
1. An in-line process for making a thin film electronic device on a substrate, comprising the steps of: a) depositing a structurable layer onto a substrate; b) depositing a patternable material onto the structurable layer in a first pattern using an integrated processing head comprising a print head, a cure head and a scan head; and c) etching the structurable layer in areas uncovered by the patternable material; said steps being carried out without intermediate exposure of the substrate to ambient air.
2. The in-line process of claim 1 , wherein the structurable layer is an insulating layer, a metal layer, a TCO layer or a semiconducting layer.
3. The in-line process according to claim 1 , wherein the thin film electronic device is a thin film transistor.
4. The in-line process according to claim 1 , wherein step a) comprises a plasma-enhanced chemical vapor deposition process.
5. The in-line process according to claim 1 , wherein step a) comprises sputtering of a material selected from the group consisting of metals and TCO.
6. The in-line process according to claim 1 , wherein step a) comprises evaporation of a material selected from the group consisting of metals and TCO.
7. The in-line process according to claim 1 , wherein step b) comprises depositing the patternable material onto the structurable layer in a first pattern and selectively treating the patternable material to produce a second pattern within the first pattern.
8. The in-line process according to claim 7 , wherein the step of depositing patternable material is followed by selectively curing the patternable material by irradiation using a mask.
9. The in-line process according to claim 7 , wherein the step of depositing patternable material is followed by selectively curing the patternable material by irradiation using direct imaging.
10. The in-line process according to claim 1 , wherein step b) comprises a scanning step to determine the location of existing structures on the substrate.
11. The in-line process of claim 1 , wherein the step of depositing patternable material is integrated with a step of selectively curing said patternable material.
12. The in-line process of claim 1 , wherein step b) comprises a scanning step to determine the correct deposition of the patternable material on the structurable layer.
13. The in-line process according to claim 1 , which is a continuous process.
14. The in-line process according to claim 13 , further comprising feedback loops based on in-line quality checks.
15. The in-line process according to claim 1 , further comprising subsequently removing substantially all the patternable material.
16. The in-line process of claim 1 , further comprising a process step selected from the group consisting of a washing step, a pre-bake step of the patternable material, a post-bake step of the patternable material, a step of annealing of the structured layer, and combinations thereof.
17. The in-line process according to claim 1 wherein patternable material is removed by laser ablation.
18. The in-line process according to claim 1 , wherein the patternable material is a negative photoresist and the process further comprises developing the photoresist material.
19. The in-line process according to claim 1 , wherein the patternable material is a positive photoresist and the process further comprises developing the photoresist material.
20. The in-line process according to claim 1 , wherein the patternable material is responsive to surface energy.
21. The in-line process according to claim 1 , wherein the patternable material is an ablatable lacquer.
22. An in-line process for the manufacture of a flat panel display, incorporating the in-line process of claim 1 .
23. The in-line process according to claim 1 comprising:
a) an in-line process for making thin film transistors on a substrate, said thin film transistors being arranged as pixels;
b) an in-line process for printing organic light emitting material in discrete areas associated with said pixels; and
c) an in-line process for providing a cathode to the organic light emitting material to form an OLED device, and for covering said OLED device with encapsulation layers.
24. The in-line process of claim 23 wherein organic light emitting materials emitting light of different colors are combined to form a pixel.
25. The in-line process of claim 23 wherein organic light emitting material emitting light of one color is combined with color filters to form a pixel.
26. The in-line process of claim 23 wherein organic light emitting material emitting light of one color is combined with phosphorescing material to form a pixel.
27. The in-line process of claim 26 wherein the phosphorescing material is applied by using a printing technique.
28. The in-line process according to claim 23 , wherein the organic light emitting material is deposited by using an evaporation technique.
29. The in-line process of claim 25 wherein the color filters are applied by using a printing technique.
30. The in-line process according to claim 23 , further comprising a cathode deposition step.