IP Library Patent Application 11723581
Patent Application
App. No. 11/723,581

Zn ion implanting method of nitride semiconductor

Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US None
App. No.
11/723,581
Abstract

A method of implanting a zinc (Zn)-ion into a nitride-based semiconductor substrate, the method includes: providing a homogeneous substrate on which a gallium nitride layer is grown; placing the homogeneous substrate in a crucible in which gallium nitride powders are coated; placing the crucible into a furnace; and performing a heat treatment process, so that a Zn-ion implantation is performed under an ammoniacal atmosphere in the furnace. The method of implanting a Zn-ion into a nitride-based semiconductor substrate, which can minimize a decomposition of a gallium nitride layer during a heat treatment process at a high temperature, easily produce a p-type, and reduce contact resistance between a semiconductor and a metal electrode, is provided.

Claims (9)

1 . A method of implanting a zinc (Zn)-ion into a nitride-based semiconductor substrate, the method comprising:

providing a homogeneous substrate on which a gallium nitride layer is grown;

placing the homogeneous substrate in a crucible in which gallium nitride powders are coated;

placing the crucible into a furnace; and

performing a heat treatment process, so that a Zn-ion implantation is performed under an ammoniacal atmosphere in the furnace.

2 . The method of claim 1 , wherein the gallium nitride powders generate a gallium nitride atmosphere within the crucible during the heat treatment process, and minimize a decomposition of the gallium nitride layer on the homogeneous substrate.

3 . The method of claim 1 , wherein a heat treatment temperature in the furnace is in the range of 1000° C. to 1300° C.

4 . The method of claim 1 , wherein a heat treatment temperature in the furnace is higher than 1300° C.

5 . The method of claim 1 , wherein the nitride-based semiconductor substrate is produced by mixing either one element or two elements selected from the group consisting of bivalent elements such as magnesium (Mg), nickel (Ni), beryllium (Be), cadmium (Cd), and the like, with Zn, so as to produce a p-type layer.

Assignments (4)
CHANGE OF NAME Recorded Aug 6, 2010
From: SAMSUNG CORNING PRECISION GLASS CO., LTD.
To: SAMSUNG CORNING PRECISION MATERIALS CO., LTD.
Reel/Frame 024804/0238 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE/ASSIGNOR PREVIOUSLY RECORDED ON REEL 020624 FRAME 0240. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER. Recorded May 16, 2008
From: SAMSUNG CORNING CO., LTD.
To: SAMSUNG CORNING PRECISION GLASS CO., LTD.
Reel/Frame 020956/0832 →
MERGER Recorded Mar 10, 2008
From: SAMSUNG CORNING PRECISION GLASS CO., LTD.
To: SAMSUNG CORNING CO., LTD.
Reel/Frame 020624/0240 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 21, 2007
From: KIM, CHONG-DON
To: SAMSUNG CORNING CO., LTD.
Reel/Frame 019125/0539 →