IP Library Granted Patent US 7,821,061
Granted Patent B2
US 7,821,061 · App. 11/729,565 · Granted Oct 26, 2010

Silicon germanium and germanium multigate and nanowire structures for logic and multilevel memory applications

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Quick Facts
Patent No.
US 7,821,061
App. No.
11/729,565
Granted
Oct 26, 2010
Kind
B2
Abstract

A method to provide a transistor or memory cell structure. The method comprises: providing a substrate including a lower Si substrate and an insulating layer on the substrate; providing a first projection extending above the insulating layer, the first projection including an Si material and a Si1-xGex material; and exposing the first projection to preferential oxidation to yield a second projection including a center region comprising Ge/Si1-yGey and a covering region comprising SiO2 and enclosing the center region.

Claims (7)

1. A microelectronic structure comprising:

a substrate including a lower Si substrate and an insulating layer on the substrate;

a projection on the substrate projecting above the insulating layer and including a center region comprising a floating nanowire channel comprising Ge/Si1-yGey and a covering region enclosing the center region, wherein the covering region comprises an insulation covering surrounding the nanowire channel and electrically insulating the nanowire channel and wherein both the center region and an interface between the center region and the covering region has substantially no dislocation defects.

2. The structure of claim 1 , wherein the structure includes a nanowire transistor comprising a high k gate dielectric, a metal gate, spacers, source and drain contacts, isolation regions and interconnects.

3. The structure of claim 1 , wherein the center region comprises a plurality of center subregions comprising respective floating nanowires, and the covering region includes an insulation covering surrounding the nanowires and electrically insulating each of the nanowires.

4. The structure of claim 3 , wherein the structure includes a multilevel memory cell comprising a control gate, spacers, source and drain contacts and interconnects.

5. The structure of claim 1 , wherein the structure includes a multilevel logic device, center region comprising a plurality of center subregions comprising respective floating nanowires, and the covering region including a high k dielectric layer and a metal gate around each of the nanowires.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 16, 2020
From: INTEL CORPORATION
To: GOOGLE LLC
Reel/Frame 054772/0918 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 8, 2010
From: JIN, BEEN-YIH; DOYLE, BRIAN S.; KAVALIEROS, JACK T.; CHAU, ROBERT S.
To: INTEL CORPORATION
Reel/Frame 024654/0123 →