IP Library Granted Patent US 7,283,222
Granted Patent B1
US 7,283,222 · App. 11/737,827 · Granted Oct 16, 2007

Optical measuring device

Assignee: Matsushita Electric Industrial Co., Ltd.
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Quick Facts
Patent No.
US 7,283,222
App. No.
11/737,827
Granted
Oct 16, 2007
Kind
B1
Abstract

An optical measuring device according to the present invention includes: a plane mirror ( 3 ), which has a central opening that functions as either a light entering window or a light source fitting hole ( 5 ) and an observation window 6 ′ that enables a photodetector ( 6 ) to take measurements; and an integrating hemisphere ( 2 ), which has its center of radius of curvature defined within the central opening of the plane mirror ( 3 ) and of which the inner wall surface functions as a light diffuse reflective surface ( 1 ). The plane mirror ( 3 ) and the integrating hemisphere ( 2 ) form an integrating space inside.

Claims (10)

1. An optical measuring device comprising:

a plane mirror, which has a central opening that functions as either a light entering window or a light source fitting hole and an observation window that enables a photodetector to take measurements; and

a hemisphere, which has its center of radius of curvature defined within the central opening of the plane mirror and of which the inner wall surface functions as a light diffuse reflective surface,

wherein the plane mirror and the hemisphere form an integrating space inside.

2. The optical measuring device of claim 1 , wherein the photodetector is fitted into the observation window of the plane mirror.

3. The optical measuring device of claim 1 , wherein in a situation where a light source, fitted into the central opening, protrudes from the plane mirror into the integrating space to a height L h , if the distance from the center of the central opening to the center of the observation window is L, the observation window has a radius R 1 , and a photosensitive plane of the photodetector has a radius R 2 ,

the photodetector is L d below the observation window and satisfies L d >L h (R 1 +R 2 )/(L−R 1 ).

4. The optical measuring device of claim 1 , wherein no baffle is arranged in the integrating space.

5. The optical measuring device of claim 1 , wherein the photodetector is a luminometer.

6. The optical measuring device of claim 5 , wherein the distance from the observation window to the central opening is 65% or more of the radius of curvature of the hemisphere.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 6, 2010
From: PANASONIC CORPORATION
To: OTSUKA ELECTRONICS CO., LTD.
Reel/Frame 024794/0375 →
CHANGE OF NAME Recorded May 21, 2010
From: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
To: PANASONIC CORPORATION
Reel/Frame 024420/0594 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 11, 2007
From: OHKUBO, KAZUAKI
To: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Reel/Frame 019946/0171 →
Continuity (1)
Continuation PCTJP200600777600 · Apr 12, 2006