IP Library Granted Patent US 7,728,418
Granted Patent B2
US 7,728,418 · App. 11/777,669 · Granted Jun 1, 2010

Semiconductor device and manufacturing method thereof

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Quick Facts
Patent No.
US 7,728,418
App. No.
11/777,669
Granted
Jun 1, 2010
Kind
B2
Abstract

A semiconductor device includes a plurality of chips comprising a plurality of first moisture-proof rings individually surrounding said plurality of chips, a second moisture-proof ring surrounding the entire plurality of chips, and a wire for connecting said plurality of chips to each other.

Claims (19)

1. A semiconductor device including a plurality of chips comprising:

a plurality of first moisture-proof rings each including a wall individually surrounding said plurality of chips;

a second moisture-proof ring surrounding the entire plurality of chips; and

an interconnection connecting said plurality of chips to each other;

wherein each of the walls includes a hole penetrating the wall, and the interconnection passes through the hole.

2. The semiconductor device according to claim 1 , wherein said plurality of chips each include a pad located within the first moisture-proof ring of each of said chips.

3. A semiconductor device comprising:

a first internal circuit;

a second internal circuit adjacent to the first internal circuit;

a first moisture-proof ring including a first wall surrounding the first internal circuit;

a second moisture-proof ring including a second wall surrounding the second internal circuit;

an interconnection connecting the first internal circuit with the second internal circuit; and

a third moisture-proof ring surrounding the first internal circuit, the second internal circuit, and the wire;

wherein the first wall includes a first hole penetrating the first wall, the second wall includes a second hole penetrating the second wall, and the interconnection passes through the first hole and the second hole.

4. The semiconductor device according to claim 3 comprising:

a first pad connected to the first internal circuit;

a second pad connected to the second internal circuit;

wherein the first pad is allocated within the first moisture-proof ring, and the second pad is allocated within the second moisture-proof ring.

5. The semiconductor device according to claim 3 , wherein any one of the first to third moisture-proof rings includes two moisture-proof rings comprising an external ring surrounding an internal ring.

Assignments (9)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 17, 2025
From: FUJITSU LIMITED
To: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
Reel/Frame 073964/0516 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 27, 2024
From: FUJITSU LIMITED
To: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
Reel/Frame 069454/0333 →
MERGER Recorded May 24, 2023
From: FUJITSU SEMICONDUCTOR LIMITED
To: FUJITSU LIMITED
Reel/Frame 064221/0545 →
CHANGE OF NAME AND CHANGE OF ADDRESS Recorded Jul 16, 2020
From: AIZU FUJITSU SEMICONDUCTOR LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 053481/0962 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 14, 2020
From: FUJITSU SEMICONDUCTOR LIMITED
To: AIZU FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 053209/0468 →
CHANGE OF ADDRESS Recorded Dec 23, 2016
From: FUJITSU SEMICONDUCTOR LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 041188/0401 →
CHANGE OF NAME Recorded Jul 9, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024651/0744 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 9, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021976/0089 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 19, 2007
From: NOMURA, HIROSHI; OTSUKA, SATOSHI; TAKAO, YOSHIHIRO
To: FUJITSU LIMITED
Reel/Frame 019575/0228 →