IP Library Granted Patent US 7,659,557
Granted Patent B2
US 7,659,557 · App. 11/798,873 · Granted Feb 9, 2010

Semiconductor light-emitting device and method of fabricating the same

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Quick Facts
Patent No.
US 7,659,557
App. No.
11/798,873
Granted
Feb 9, 2010
Kind
B2
Abstract

The invention provides a semiconductor light-emitting device with II-V group (or II-IV-V group) compound contact layer and a method of fabricating the same. The semiconductor light-emitting device according to a preferred embodiment of the invention includes a substrate, a first conductive type semiconductor material layer, a light-emitting layer, a first electrode, a second conductive type semiconductor material layer, a II-V group (or II-IV-V group) compound contact layer, a transparent conductive layer, and a second electrode. The existence of the II-V group (or II-IV-V group) compound contact layer improves the ohmic contact between the second conductive type semiconductor material layer and the transparent conductive layer.

Claims (17)

1. A semiconductor light-emitting device, comprising:

a substrate;

a first conductive type semiconductor material layer, formed on the substrate;

a light-emitting layer, formed on the first conductive type semiconductor material layer such that a partial area of the first conductive type semiconductor material layer is exposed;

a first electrode, formed on the exposed partial area of the first conductive type semiconductor material layer;

a second conductive type semiconductor material layer, formed on the light-emitting layer;

a II-IV-V group compound ohmic contact layer, formed on the second conductive type semiconductor material layer, wherein the material of the II-IV-V group compound ohmic contact layer is represented by the general formula: M x NyQ z , where M represents the II group chemical element, N represents the IV group chemical element, Q represents the V group chemical element, 1≦x≦3, 1≦y≦3, 1≦z≦3, and x and y and z are molar numbers;

a transparent conductive layer, formed on the II-IV-V group compound ohmic contact layer such that a partial area of the II-IV-V group compound ohmic contact layer is exposed; and

a second electrode, formed on the exposed partial area of the II-IV-V group compound ohmic contact layer and contacting the transparent conductive layer.

2. The semiconductor light-emitting device of claim 1 , wherein the substrate is formed of a material selected from a group consisting of Si, GaN, AlN, sapphire, spinnel, SiC, GaAs, Al 2 O 3 , LiGaO 2 , LiAlO 2 , and MgAl 2 O 4 .

3. The semiconductor light-emitting device of claim 1 , wherein the first conductive type semiconductor material layer and the second conductive type semiconductor material layer are formed of a GaN material, respectively.

4. The semiconductor light-emitting device of claim 1 , wherein the first conductive type is N-type, and the second conductive type is P-type.

5. The semiconductor light-emitting device of claim 1 , wherein the light-emitting layer is formed of a material selected from a group consisting of InGaN, AlGaN, and, InGaAs.

6. The semiconductor light-emitting device of claim 1 , wherein a II group chemical element in the II-IV-V group compound ohmic contact layer is one selected from the group consisting of Zn, Be, Mg, Ca, Sr, Ba, and Ra, and a IV group chemical element in the II-IV-V group compound ohmic contact layer is one selected from the group consisting of C, Si, Ge, Sn, and Pb, and a V group chemical element in the II-IV-V group compound ohmic contact layer is one selected from the group consisting of N, P, As, Sb, and Bi.

7. The semiconductor light-emitting device of claim 1 , wherein the thickness of the II-IV-V group compound ohmic contact layer ranges from 0.5 Angstroms to 500 Angstroms.

8. The semiconductor light-emitting device of claim 1 , wherein the II-IV-V group compound ohmic contact layer is formed at a temperature ranging from 400° C. to 1100° C.

9. The semiconductor light-emitting device of claim 1 , wherein the transparent conductive layer is formed of a material selected from a group consisting of Ni/Au, ITO, CTO, TiWN, In 2 O 3 , SnO 2 , CdO, ZnO, CuGaO 2 , and SrCu 2 O 2 .

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 13, 2016
From: HUGA OPTOTECH INC.
To: EPISTAR CORPORATION
Reel/Frame 040350/0699 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 3, 2011
From: RHODIA INC.
To: RHODIA OPERATIONS
Reel/Frame 025756/0342 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 20, 2011
From: RHODIA INC.
To: RHODIA OPERATIONS
Reel/Frame 025736/0801 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 17, 2007
From: TSAI, CHIUNG-CHI; TSAI, TZONG-LIANG; LI, YU-CHU
To: HUGA OPTOTECH INC.
Reel/Frame 019368/0132 →