Arrangement for microscopic observation and/or detection in a light scanning microscope with line scanning and use
Arrangement for microscopic observation and/or detection of a sample that is at least partially transparent by way of a microscope objective in a light scanning microscope with line-shaped illumination, whereby an illumination of the sample outside the objective is carried out from at least from one side at an angle to the optical axis of the objective and the illumination light is focused on the sample with a smaller aperture than that of the viewing objective and that a coupling of the illumination light over a beam splitter, preferably in the objective pupil, is carried out for coupling, at its circumference, slightly expanding transmitting or reflecting areas for steering the illumination light to the sample, but otherwise is designed so that it is reflecting or transmitting for the sample light on the rest of the area.
1 - 22 . (canceled)
23 . A microscope for detecting at least one sample region, comprising:
means for creating at least one bundle of parallel illumination beams,
a microscope objective including a housing, viewing optics for viewing at least partially transparent samples, at least one light guide in the housing outside of the viewing optics for guiding the at least one bundle of parallel illumination beams, an objective aperture, and at least one reflector for diverting the at least one bundle of parallel illumination beams for illuminating the sample from at least one side at an angle perpendicular to the optical axis of the viewing optics,
means for generating an illumination line in the sample perpendicular to the optical axis of the viewing optics by focusing the at least one bundle of parallel illumination beams into the sample using an aperture smaller than the objective aperture, and
a beam splitter including on its circumference regions that are slightly extended for coupling in the at least one bundle of parallel illumination beams and directing it to the sample, wherein the regions are one of transmitting and reflection, and wherein substantially the remainder of the area of the beam splitter is formed to have opposite transmission and reflection characteristics from the regions with respect to the sample light.
24 . The microscope according to claim 23 , wherein the at least one reflector is the means for generating an illumination line, and wherein the reflector is an imaging mirror which focuses the illumination light in the direction of the sample.
25 . The microscope according to claim 23 , wherein the at least one reflector is a planar mirror and the means for generating an illumination line comprises an imaging element in the light guide.
26 . The microscope according to claim 23 , wherein there are two bundles of parallel illumination beams and two reflectors for illuminating the sample from two sides with a common focal point.
27 . The microscope according to claim 24 , wherein there are two bundles of parallel illumination beams and two reflectors for illuminating the sample from two sides with a common focal point.
28 . The microscope according to claim 25 , wherein there are two bundles of parallel illumination beams and two reflectors for illuminating the sample from two sides with a common focal point.
29 . The microscope according to claim 23 , further comprising an objective pupil, wherein the beam splitter is in the objective pupil.
30 . The microscope according to claim 23 , wherein the regions are transmitting and substantially the remainder of the area of the beam splitter is reflecting.
31 . The microscope according to claim 23 , wherein the regions are reflecting and substantially the remainder of the area of the beam splitter is transmitting.
32 . Method for the examination of weak sample interactions, comprising detecting at least one sample region using the microscope as claimed in claim 23 .
33 . The method of claim 32 , wherein the weak sample interactions are Raman effects.