IP Library Granted Patent US 7,921,719
Granted Patent B2
US 7,921,719 · App. 11/820,629 · Granted Apr 12, 2011

Method and apparatus for storing vacuum gauge calibration parameters and measurement data on a vacuum gauge structure

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Quick Facts
Patent No.
US 7,921,719
App. No.
11/820,629
Granted
Apr 12, 2011
Kind
B2
Abstract

A method and apparatus for measuring gas pressure by combining an ionization gauge with at least one other vacuum sensor. Nonvolatile memory coupled to the vacuum gauge contains calibration parameters unique to each individual sensor based on factory calibration. The nonvolatile memory may contain calibration parameters for a heat-sensitive vacuum sensor to compensate for the temperature gradients generated by the ionization gauge. The calibration parameters are a function of calibration data determined when the ionization gauge is both on and off. The nonvolatile memory may store a window of measurement data of the vacuum gauge that is updated at predetermined time intervals and in response to an event, such as an error event, to aid in investigating the cause of vacuum gauge malfunction or failure.

Claims (44)

1. An apparatus for measuring gas pressure in an environment comprising, in a gauge assembly:

a vacuum gauge;

nonvolatile memory coupled to the vacuum gauge for later gauge analysis; and

a processor that responds to an error event to store, in the nonvolatile memory, noncalibration measurement data, sensed by the vacuum gauge, to be available for analysis after failure of the gauge.

2. The apparatus according to claim 1 , wherein the nonvolatile memory is integral to the vacuum gauge.

3. The apparatus according to claim 1 , wherein the nonvolatile memory is updated at predetermined time intervals.

4. The apparatus according to claim 3 , wherein a window of measurement data is stored in the nonvolatile memory.

5. The apparatus according to claim 1 , wherein a window of measurement data is stored in the nonvolatile memory.

6. The apparatus according to claim 1 , wherein the vacuum gauge comprises an ionization gauge, a heat-loss sensor, and a diaphragm sensor.

7. The apparatus according to claim 1 , wherein the vacuum gauge includes an ionization gauge and the measurement data of the ionization gauge includes filament emission current and ion current.

8. The apparatus according to claim 1 , wherein the vacuum gauge includes a heat-loss sensor and the measurement data of the heat-loss sensor includes sensed electrical parameters of a heat-loss sensor.

9. The apparatus according to claim 1 , wherein the vacuum gauge includes a diaphragm sensor and the measurement data of the diaphragm sensor includes an output from an electronic circuit of the diaphragm sensor.

10. A method for measuring gas pressure in an environment comprising the steps of:

providing a vacuum gauge;

providing nonvolatile memory coupled to the vacuum gauge; and

storing noncalibration measurement data sensed by the vacuum gauge during operation in the nonvolatile memory for later gauge analysis after failure.

11. The method according to claim 10 , wherein the nonvolatile memory is integral to the vacuum gauge.

12. The method according to claim 10 , wherein the nonvolatile memory is updated at predetermined time intervals.

13. The method according to claim 12 , wherein a window of measurement data is stored in the nonvolatile memory.

14. The method according to claim 10 , wherein the nonvolatile memory is updated in response to an event.

15. The method according to claim 14 , wherein a window of measurement data is stored in the nonvolatile memory.

16. The method according to claim 14 , wherein the event is an error.

17. The method according to claim 10 , wherein the vacuum gauge comprises an ionization gauge, a heat-loss sensor, and a diaphragm sensor.

18. The method according to claim 10 , wherein the vacuum gauge includes an ionization gauge and the measurement data of the ionization gauge includes filament emission current and ion current.

19. The method according to claim 10 , wherein the vacuum gauge includes a heat sensor and the measurement data of the heat-loss sensor includes sensed electrical parameters of the heat-loss sensor.

20. The method according to claim 10 , wherein the vacuum gauge includes a diaphragm sensor and the measurement data of the diaphragm sensor includes an output from an electronic circuit of the diaphragm sensor.

21. A method for measuring gas pressure in an environment comprising the steps of:

providing a vacuum gauge assembly comprising:

a vacuum gauge;

nonvolatile memory coupled to the vacuum gauge; and

a processor that stores measurement data sensed by the vacuum gauge in

the nonvolatile memory; and

after failure of the vacuum gauge, analyzing stored measurement data.

22. The method according to claim 21 , wherein the nonvolatile memory is integral to the vacuum gauge.

23. The method according to claim 21 , wherein the nonvolatile memory is updated at predetermined time intervals.

24. The method according to claim 23 , wherein a window of measurement data is stored in the nonvolatile memory.

25. The method according to claim 21 , wherein the nonvolatile memory is updated in response to an event.

26. The method according to claim 25 , wherein a window of measurement data is stored in the nonvolatile memory.

27. The method according to claim 25 , wherein the event is an error.

28. The method according to claim 21 , wherein the vacuum gauge comprises an ionization gauge, a heat-loss sensor, and a diaphragm sensor.

29. The method according to claim 21 , wherein the vacuum gauge includes an ionization gauge and the measurement data of the ionization gauge includes filament emission current and ion current.

30. An apparatus for measuring gas pressure in an environment comprising:

a vacuum gauge comprising an ionization gauge, a heat-loss sensor, and a diaphragm sensor; and

nonvolatile memory coupled to the vacuum gauge for later gauge analysis, the nonvolatile memory storing measurement data of the vacuum gauge.

Assignments (12)
RELEASE OF SECURITY INTEREST Recorded Aug 24, 2022
From: BARCLAYS BANK PLC
To: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION; ELECTRO SCIENTIFIC INDUSTRIES, INC.
Reel/Frame 063009/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 24, 2022
From: BARCLAYS BANK PLC
To: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION; ELECTRO SCIENTIFIC INDUSTRIES, INC.
Reel/Frame 062739/0001 →
SECURITY INTEREST Recorded Aug 19, 2022
From: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION; ELECTRO SCIENTIFIC INDUSTRIES, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 061572/0069 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE U.S. PATENT NO.7,919,646 PREVIOUSLY RECORDED ON REEL 048211 FRAME 0312. ASSIGNOR(S) HEREBY CONFIRMS THE PATENT SECURITY AGREEMENT (ABL). Recorded Jan 14, 2021
From: ELECTRO SCIENTIFIC INDUSTRIES, INC.; MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
To: BARCLAYS BANK PLC, AS COLLATERAL AGENT
Reel/Frame 055668/0687 →
RELEASE OF SECURITY INTEREST Recorded Feb 1, 2019
From: DEUTSCHE BANK AG NEW YORK BRANCH
To: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
Reel/Frame 048226/0095 →
PATENT SECURITY AGREEMENT (ABL) Recorded Feb 1, 2019
From: ELECTRO SCIENTIFIC INDUSTRIES, INC.; MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
To: BARCLAYS BANK PLC, AS COLLATERAL AGENT
Reel/Frame 048211/0312 →
SECURITY AGREEMENT Recorded May 4, 2016
From: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038663/0265 →
SECURITY AGREEMENT Recorded May 4, 2016
From: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
To: BARCLAYS BANK PLC; BARCLAYS BANK PLC
Reel/Frame 038663/0139 →
CORRECTIVE ASSIGNMENT TO CORRECT THE STATE OF INCORPORATION INSIDE ASSIGNMENT PREVIOUSLY RECORDED AT REEL: 033190 FRAME: 0755. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Oct 10, 2014
From: BROOKS AUTOMATION, INC.
To: MKS INSTRUMENTS, INC.
Reel/Frame 033958/0363 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 26, 2014
From: BROOKS AUTOMATION, INC.
To: MKS INSTRUMENTS, INC.
Reel/Frame 033190/0755 →
MERGER Recorded Jan 10, 2011
From: HELIX TECHNOLOGY CORPORATION
To: BROOKS AUTOMATION, INC.
Reel/Frame 025606/0125 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 6, 2011
From: ARNOLD, PAUL C.; CARMICHAEL, LARRY K.; RUTT, PAUL M.
To: HELIX TECHNOLOGY CORPORATION
Reel/Frame 025593/0403 →