IP Library › Granted Patent US 7,656,627
Granted Patent B2
US 7,656,627 · App. 11/826,634 · Granted Feb 2, 2010

ESD protection circuit with active triggering

Assignee: Amazing Microelectronic Corp.
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Quick Facts
Patent No.
US 7,656,627
App. No.
11/826,634
Granted
Feb 2, 2010
Kind
B2
Abstract

An ESD protection circuit is provided. The circuit includes a discharging component, a diode, and an ESD detection circuit. The discharging component is coupled between an input/output pad and a first power line of an IC. The diode is coupled between the input/output pad and a second power line of the IC in a forward direction toward the second power line. The ESD detection circuit includes a capacitor, a resistor, and a triggering component. The capacitor and the resistor are formed in series and coupled between the first power line and the second power line. The triggering component has a positive power end coupled to the input/output pad and a negative power end coupled to the first power line. An input of the triggering component is coupled to a node between the capacitor and the resistor.

Claims (15)

1. An electrostatic discharge (ESD) protection circuit, comprising:

a first discharging component, coupled between an input/output pad and a first power line of an IC;

a second discharging component, coupled between the input/output pad and a second power line of the IC;

a first diode coupled between the input/output pad and a first ESD bus in a forward direction toward the first ESD bus; a second diode coupled between the first ESD bus and the second power line in a forward direction toward the first ESD bus;

a third diode coupled between the input/output pad and a second ESD bus in a forward direction toward the input/output pad;

a fourth diode coupled between the second ESD bus and the first power line in a forward direction toward the first power line; and

an ESD detection circuit, comprising:

a capacitor and a resistor formed in series, and coupled between the first power line and the second power line;

a first triggering component, having a first positive power end coupled to the first ESD bus and a first negative power end coupled to the first power line; a first input of the first triggering component being coupled to a node between the capacitor and the resistor; and

a second triggering component, having a second positive power end coupled to the second power line and a second negative power end coupled to the second ESD bus, a second input of the second triggering component being coupled to the node between the capacitor and the resistor;

wherein the first and the second discharging components are turned off during normal power operations; the first discharging component is triggered by a first output of the first triggering component in a first ESD event, and the second discharging component is triggered by a second output of the second triggering component in a second ESD event.

2. The ESD protection circuit of claim 1 , wherein the first discharging component is a gate-driven NMOS, a gate-grounded NMOS, an NMOS with its gate terminal coupled to a pre-buffer, an NPN BJT, or a P-type substrate-triggered SCR.

3. The ESD protection circuit of claim 1 , wherein the second discharging component is a gate-driven PMOS, a gate-VDD PMOS, a PMOS with its gate terminal coupled to a pre-buffer, a PNP BJT, or a N-type substrate-triggered SCR.

4. The ESD protection circuit of claim 1 , wherein the first triggering component is an inverter, an M-input NAND with all inputs coupled together, or an N-input NOR with all inputs coupled together, M and N are positive integers larger than 1, respectively.

5. The ESD protection circuit of claim 1 , wherein the second triggering component comprises one selected from the group consisting of: two inverters coupled in series, an M-input NAND coupled in series with an N-input NAND, and an M-input NOR coupled in series with an N-input NOR, an M-input NAND coupled in series with an N-input NOR, wherein the M inputs are coupled with each other, the N inputs are coupled with each other, M and N are positive integers larger than 1, respectively.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 17, 2007
From: KER, MING-DOU; HSIAO, YUAN-WEN; JIANG, RYAN HSIN-CHIN
To: AMAZING MICROELECTRONIC CORP.
Reel/Frame 019598/0602 →
Continuity (1)
Related Publication 20090021872A1 · Jan 22, 2009