Automated contact alignment tool
View Patent ↗A method for determining the alignment of a plurality of contacts in an electronic testing machine is disclosed. The contacts are swept over an electronic component taking a plurality of electrical readings. These electrical readings are charted against a desired orientation to determine alignment. Alignment can be corrected as necessary using an adjustment mechanism.
1. A method for determining a position of a plurality of test contacts on an electronic component testing machine, the component testing machine including a component test plate configured to retain a plurality of electronic components, the test plate movable between a plurality of index positions such that electronic components electrically connect to the test contacts at each index position; the method comprising:
microstepping the test plate between the plurality of index positions, where each microstep movement is a fraction of an index movement;
measuring the electrical connectivity between an electronic component and a test contact at each of a plurality of microsteps, such that a plurality of electrical measurements is provided for an individual test contact; and
evaluating the plurality of measurements to determine the alignment of the test contact.
2. The method as in claim 1 wherein the plurality of measurements is evaluated to determine whether an intermittent contact condition exists.
3. The method as in claim 1 wherein the measurements for a single contact are compared against a centerline to determine whether the alignment is leading or lagging.
4. The method as in claim 3 wherein the centerline is measured against a pair of blow off holes located on the electronic testing machine.
5. The method as in claim 1 wherein the plurality of measurements is graphically depicted.
6. The method as in claim 5 wherein the graphical depiction includes a centerline.
7. The method as in claim 1 wherein the plurality of test contacts is evaluated.
8. The method as in claim 7 wherein the plurality of test contacts form at least one test head.
9. The method of claim 1 wherein each index is divided into about 200 microsteps.
10. A method for aligning at least one of a plurality of test contacts on an electronic component testing machine, the component testing machine including a test plate configured to retain a plurality of electronic components, the test plate movable between a plurality of index positions such that electronic components electrically connect to the plurality of test contacts, the method comprising:
microstepping the test plate between the plurality of index positions, wherein each microstep movement is a fraction of an index movement;
measuring the electrical connectivity between the electronic component and a test contact at each of a plurality of micro steps such that a plurality of electrical measurements is provided for a single test contact; and
adjusting the test contact based on the plurality of electrical measurements.
11. The method of claim 10 wherein the test contact is part of a test head, the test head including a plurality of test contacts.
12. The method of claim 11 wherein the test head includes a theta adjustment and a y skew adjustment.
13. The method of claim 11 wherein the plurality of test contacts are collectively adjusted by adjusting the test head.
14. The method of claim 10 wherein the test contact is adjusted relative to a centerline, the centerline being a function of a fixed position on the test machine.
15. The method of claim 14 wherein the test contact is adjusted relative to a dynamic centerline.
16. The method of claim 15 wherein the test contact may be adjusted to be biased in a leading orientation.
17. The method of claim 10 wherein each index is divided into about 200 microsteps.