IP Library Granted Patent US 7,508,907
Granted Patent B2
US 7,508,907 · App. 11/845,540 · Granted Mar 24, 2009

X-ray analysis apparatus

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Quick Facts
Patent No.
US 7,508,907
App. No.
11/845,540
Granted
Mar 24, 2009
Kind
B2
Abstract

When an X-ray focused by using an X-ray lens is irradiated to a sample, there is generated an X-ray halo component at the peripheral part of the focal point of the focused X-ray in the sample and, by this, precision of an analysis of a microscopic region becomes an issue. In order to control the shape of the X-rays from the X-ray lens, a collimator is installed between the X-ray lens and the sample, with an opening part having a tapering shape in which the opening at the side toward the sample is made smaller than that at the side toward the X-ray lens.

Claims (19)

1. An X-ray analysis apparatus comprising:

an X-ray tubular bulb configured to generate an X-ray;

an X-ray lens having one end which receives the X-ray from the X-ray tubular bulb and another end which emits the focused X-ray onto a sample;

a collimator provided between said another end of the X-ray lens and the sample at non-zero distances away therefrom, the collimator having an opening formed therethrough which is shaped to have cross-sections substantially equal to or smaller than corresponding cross-sections of the focused X-ray passing through the opening; and

a detector configured to detect a fluorescent X-ray excited out from the sample by the focused X-ray allowed through the opening of the collimator.

2. An X-ray analysis apparatus according to claim 1 , wherein the opening of the collimator is shaped to have the cross-sections substantially equal to the corresponding cross-sections the focused X-rays passing through the opening.

3. An X-ray analysis apparatus according to claim 1 , wherein the opening of the collimator is shaped to have the cross-sections smaller than the corresponding cross-sections of the focused X-rays passing through the opening.

4. An X-ray analysis apparatus according to claim 3 , wherein the opening is shaped to have the cross-sections each smaller by a constant rate than a corresponding cross-section of the focused X-ray passing through the opening.

5. An X-ray analysis apparatus according to claim 4 , wherein the constant rate is about 20%.

6. An X-ray analysis apparatus according to claim 1 , wherein the collimator is positioned closer to the sample than to the X-ray lens.

7. An X-ray analysis apparatus according to claim 1 , wherein the detector has a function detecting the X-ray.

8. An X-ray analysis apparatus according to claim 1 , wherein the X-ray lens is made of a polycapillary.

9. An X-ray analysis apparatus according to claim 1 , wherein the opening is shaped to become generally narrower from an X-ray entrance thereof towards an X-ray exit thereof.

10. An X-ray analysis apparatus according to claim 1 , wherein the opening has a cross-section of a shape other than a circle.

11. An X-ray analysis apparatus according to claim 1 , wherein the opening has a peripheral wall which is concave in shape.

12. An X-ray analysis apparatus according to claim 1 , further comprising at least one other collimator having an opening of a shape different from that of the opening of the collimator.

13. An X-ray analysis apparatus according to claim 1 , wherein the collimator has a thickness of about 1 mm.

14. An X-ray analysis apparatus according to claim 1 , wherein the X-ray tubular bulb generates the X-ray at a maximum energy of 50 KV sufficiently strong to emit an innegligible amount of halo X-ray onto the sample without the collimator.

15. An X-ray analysis apparatus according to claim 1 , further comprising a case surrounding the X-ray lens configured to block halo X-ray from the X-ray lens.

Assignments (2)
CHANGE OF NAME Recorded Sep 17, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033764/0615 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 9, 2007
From: SASAYAMA, NORIO
To: SII NANO TECHNOLOGY INC.
Reel/Frame 020090/0166 →