IP Library Granted Patent US 7,595,226
Granted Patent B2
US 7,595,226 · App. 11/846,671 · Granted Sep 29, 2009

Method of packaging an integrated circuit die

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Quick Facts
Patent No.
US 7,595,226
App. No.
11/846,671
Granted
Sep 29, 2009
Kind
B2
Abstract

A structure ( 40 ) for holding an integrated circuit die ( 38 ) during packaging includes a support substrate ( 42 ), a release film ( 44 ) attached to the substrate ( 42 ), and a swelling agent ( 60 ). A method ( 34 ) of packaging the die ( 38 ) includes placing the die ( 38 ) on the substrate ( 42 ) with its active surface ( 52 ) and bond pads ( 54 ) in contact with the film ( 44 ). The agent ( 60 ) is applied over an adhesive coating ( 50 ) of the film ( 44 ). The agent ( 60 ) causes the adhesive ( 50 ) to swell into contact with the bond pads ( 54 ) and/or to form fillets ( 64 ) of adhesive ( 50 ) about the die ( 38 ). The die ( 38 ) is encapsulated in a molding material ( 72 ) and released from the substrate ( 42 ) as a panel ( 74 ) of dies ( 38 ). Swelling of the adhesive ( 50 ) about the bond pads ( 54 ) prevents the molding material ( 72 ) from bleeding onto the bond pads ( 54 ).

Claims (42)

1. A method of packaging an integrated circuit (IC) die having bond pads located on an active surface of said IC die, said method comprising:

attaching a release film over a support substrate, said release film having an adhesive coating situated on a side of said film opposite said support substrate;

placing said IC die on said support substrate with said active surface in contact with said release film;

applying a swelling agent over said adhesive coating;

allowing said adhesive coating to swell into contact with said bond pads in response to application of said swelling agent;

encapsulating said IC die in a molding material; and

releasing said IC die from said support substrate.

2. A method as claimed in claim 1 further comprising selecting a solvent as said swelling agent.

3. A method as claimed in claim 2 wherein said selecting operation comprises selecting a non-polar solvent as said solvent.

4. A method as claimed in claim 2 further comprising selecting said solvent from a group of solvents that exhibits a boiling temperature in a range of fifty to one hundred and fifty degrees Celsius.

5. A method as claimed in claim 1 further comprising selecting toluene as said swelling agent.

6. A method as claimed in claim 1 further comprising selecting said release film having said adhesive coating formed from a silicone polymer.

7. A method as claimed in claim 1 wherein said applying operation comprises distributing said swelling agent uniformly over said adhesive coating.

8. A method as claimed in claim 1 wherein said applying operation comprises distributing said swelling agent as an atomized spray over said adhesive coating.

9. A method as claimed in claim 1 wherein said applying operation comprises spraying said swelling agent over said adhesive coating at a pressure in a range of 0.5-5 psi.

10. A method as claimed in claim 1 wherein said allowing operation comprises forming a fillet of said adhesive coating about a perimeter of said IC die, said fillet exhibiting a height in a range of approximately one half to one hundred microns.

11. A method as claimed in claim 1 further comprising preventing a flow of said molding material onto said bond pads of said IC die when said adhesive coating swells around at least an active surface of said IC die.

12. A method as claimed in claim 1 wherein said IC die is one of multiple IC dies, each of said multiple IC dies having said active surface, and said method further comprises:

placing each of said multiple IC dies on said support substrate with said active surface facing said release film;

applying said swelling agent over said adhesive coating of said release film;

allowing said adhesive coating to swell into contact with said bond pads on said active surface of said each of said multiple IC dies in response to application of said swelling agent;

concurrently encapsulating said multiple IC dies in said molding material following said applying operation;

releasing said multiple IC dies from said support substrate as a panel following said encapsulating operation; and

separating said multiple IC dies of said panel to form individual IC packages.

13. A structure for temporarily holding at least one integrated circuit (IC) die during packaging thereof, said IC die having bond pads located on an active surface of said IC die, said structure comprising:

a support substrate;

a release film overlying a surface of said support substrate, said release film including a polyimide liner coated with a silicone polymer adhesive coating, wherein said adhesive coating temporarily holds said active surface of said at least one IC die in a desired placement on said support substrate and is swollen by an amount that encapsulates at least said active surface of said IC die in response to application of a solvent adapted to cause swelling of said adhesive coating, said solvent having been uniformly distributed as an atomized spray over said adhesive coating to cause said adhesive coating to swell into contact with said bond pads and encapsulate at least said active surface of said IC die.

14. A structure as claimed in claim 13 wherein said solvent exhibits a boiling temperature in a range of fifty to one hundred and fifty degrees Celsius.

15. A structure as claimed in claim 13 wherein said solvent is a non-polar solvent.

16. A structure as claimed in claim 13 wherein said solvent comprises toluene.

17. A method of packaging an integrated circuit (IC) die having bond pads located on an active surface of said IC die, said method comprising:

attaching a release film over a support substrate, said release film having an adhesive coating situated on a side of said film opposite said support substrate;

placing said IC die on said support substrate with said active surface in contact with said release film;

applying a swelling agent over said adhesive coating by uniformly distributing said swelling agent over said adhesive coating as an atomized spray;

allowing said adhesive coating to swell into contact with said bond pads in response to application of said swelling agent;

encapsulating said IC die in a molding material, wherein when said adhesive coating swells around said IC die, said molding material is prevented from flowing onto said bond pads of said IC die; and

releasing said IC die from said support substrate following encapsulation of said IC die.

18. A method as claimed in claim 17 further comprising:

utilizing said release film having said adhesive coating formed from a silicone polymer; and

selecting a non-polar solvent as said swelling agent.

19. A method as claimed in claim 17 further comprising selecting said solvent from a group of solvents that exhibits a boiling temperature in a range of fifty to one hundred and fifty degrees Celsius.

20. A method as claimed in claim 17 wherein said allowing operation comprises forming a fillet of said adhesive coating about a perimeter of said IC die, said fillet exhibiting a height in a range of approximately one half to one hundred microns.

Assignments (32)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
323.01(C) ASSIGNMENT OR CHANGE OF NAME IMPROPERLY FILED AND RECORDED BY ANOTHER PERSON AGAINST OWNER'S PATENT Recorded Oct 3, 2019
From: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
To: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Reel/Frame 052459/0656 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042762/0145 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 15, 2017
From: NORTH STAR INNOVATIONS INC.
To: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Reel/Frame 041717/0736 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
PATENT RELEASE Recorded Aug 17, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 039707/0471 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12092129 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Jul 14, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039361/0212 →
SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038017/0058 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 4, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NORTH STAR INNOVATIONS INC.
Reel/Frame 037694/0264 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0553 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0704 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0854 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037356/0143 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →
SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030633/0424 →
SECURITY AGREEMENT Recorded May 13, 2010
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 024397/0001 →
SECURITY AGREEMENT Recorded Feb 3, 2010
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A.
Reel/Frame 023882/0834 →
SECURITY AGREEMENT Recorded Feb 16, 2008
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A.
Reel/Frame 020518/0215 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 29, 2007
From: LYTLE, WILLIAM H.; FAY, OWEN R.; XU, JIANWEN
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 019760/0551 →