IP Library Granted Patent US 7,498,848
Granted Patent B2
US 7,498,848 · App. 11/851,380 · Granted Mar 3, 2009

System and method for monitoring clock signal in an integrated circuit

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Quick Facts
Patent No.
US 7,498,848
App. No.
11/851,380
Granted
Mar 3, 2009
Kind
B2
Abstract

A clock monitor system for monitoring an input clock signal in an integrated circuit (IC) includes a clock failure detection circuit and a delay circuit. The clock failure detection circuit generates a control signal based on the input clock signal. The delay circuit is connected to the clock failure detection circuit and provides a clock status signal based on the control signal. The clock status signal indicates whether the input clock signal is operating correctly. The delay circuit provides the clock status signal to the IC after a predetermined number of input clock cycles.

Claims (26)

1. A clock monitor system for monitoring an input clock signal to an integrated circuit(IC), wherein the input clock signal switches alternatively between a first logic level and a second logic level, the clock monitor system comprising:

a clock failure detection circuit that generates a control signal based on an input clock signal switching; and

a delay circuit connected to the clock failure detection circuit that provides a clock status signal to the IC based on the control signal after a pre-determined number of input clock cycles, wherein the clock status signal indicates a failure of the input clock signal; and

wherein the clock failure detection circuit comprises:

a plurality of transistors that monitor the input clock signal, wherein at least one of the plurality of transistors is in an OFF state during a first time slot, and wherein each of the plurality of transistors is in an ON state during a second time slot;

an energy storage element connected to the plurality of transistors that charges during the second time slot and discharges during the first time slot; and

an output circuit connected to the energy storage element that generates the control signal based on a voltage level of the energy storage element, wherein the control signal is provided as an input to the delay circuit.

2. The clock monitor system for monitoring the input clock signal of claim 1 , wherein the storage element comprises a capacitor.

3. The clock monitor system for monitoring the input clock signal of claim 1 , wherein the clock failure detection circuit further comprises:

one or more discharge paths connected in parallel to the energy storage element, wherein the one or more discharge path discharge the storage element during the first time slot, and wherein a discharge path of the one or more discharge path is selected based on a frequency range of the input clock signal; and

one or more delay elements connected to the plurality of transistors that apply a distinct phase shifted input clock signal to at least one of the plurality of transistors.

4. The clock monitor system for monitoring the input clock signal of claim 3 , wherein each of the one or more discharge paths comprises one or more transistors.

5. The clock monitor system for monitoring the input clock signal of claim 3 , wherein each of the one or more discharge paths comprises one or more resistors.

6. The clock monitor system for monitoring the input clock signal of claim 3 , wherein the output circuit changes the control signal when the voltage level of the storage element exceeds a threshold voltage.

7. The clock monitor system for monitoring the input clock signal of claim 3 , wherein the delay circuit comprises one or more flip-flops.

8. The clock monitor system for monitoring the input clock signal of claim 7 , wherein the predetermined number of input clock cycles depends on a number of flip-flops of the one or more flip-flops.

9. A method for monitoring an input clock signal to an Integrated Circuit (IC), wherein the input clock signal switches alternatively between a first logic level and a second logic level, the method comprising the steps of:

generating a control signal based on an input clock signal switching to detect a failure of the input clock signal; and

providing a clock status signal to the IC based on the control signal after a predefined number of input clock cycles, wherein the clock status signal indicates the failure of the input clock signal to the IC; and

wherein the step of generating the control signal comprises:

switching at least one of a plurality of transistors to an OFF state during a first time slot and switching each of the plurality of transistors to an ON state during a second time slot based on the input clock signal switching;

charging an energy storage element during the second time slot and discharging the energy storage element during the first time slot; and

generating the control signal based on a voltage level of the energy storage element, wherein the control signal is used to generate the clock status signal.

10. The method for monitoring the input clock signal of claim 9 , wherein the storage element comprises a capacitor.

11. The method for monitoring the input clock signal of claim 9 , wherein the step of providing the clock status signal comprises the step of:

providing the clock status signal as an output of one or more flip-flops that are responsive to the input clock signal, wherein the predefined input clock cycle depends on a number of flip-flops of the one or more flip-flops.

Assignments (32)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
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CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
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From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
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From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
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CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
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RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
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RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
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From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
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SECURITY AGREEMENT Recorded May 13, 2010
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SECURITY AGREEMENT Recorded May 19, 2009
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SECURITY AGREEMENT Recorded Feb 16, 2008
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ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 10, 2007
From: WADHWA, SANJAY KUMAR; SRIVASTAVA, AMIT KUMAR
To: FREESCALE SEMICONDUCTOR, INC.
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