Stiffener assembly for use with testing devices
View Patent ↗A stiffener assembly for use with testing devices is provided herein. In some embodiments, a stiffener assembly for use with testing devices can be part of a probe card assembly that can include a stiffener assembly comprising an upper stiffener coupled to a plurality of lower stiffeners; and a substrate constrained between the upper stiffener and the plurality of lower stiffeners, the stiffener assembly restricting non-planar flex of the substrate while facilitating radial movement of the substrate with respect to the stiffener assembly.
1. A probe card assembly, comprising:
a stiffener assembly comprising an upper stiffener coupled to a plurality of lower stiffeners; and
a substrate constrained between the upper stiffener and the plurality of lower stiffeners, the substrate being in direct physical contact with each of the lower stiffeners, the stiffener assembly restricting non-planar flex of the substrate while facilitating radial movement of the substrate with respect to the stiffener assembly.
2. The probe card assembly of claim 1 , wherein the upper stiffener and the plurality of lower stiffeners are coupled together through the substrate.
3. The probe card assembly of claim 1 , wherein the upper stiffener further comprises:
a plurality of extensions, each extension coupled to a respective one of the plurality of lower stiffeners.
4. The probe card assembly of claim 3 , wherein the substrate further comprises:
a plurality of slots formed about a periphery of the substrate, each slot having a respective one of the plurality of extensions disposed therein.
5. The probe card assembly of claim 3 , wherein the upper stiffener further comprises:
a plurality of radially extending arms, each arm having an extension coupling the upper stiffener to the plurality of lower stiffeners.
6. The probe card assembly of claim 5 , wherein the plurality of radially extending arms of the upper stiffener extend outward from the upper stiffener.
7. The probe card assembly of claim 1 , wherein the plurality of lower stiffeners are disposed radially with respect to a central axis of the stiffener assembly.
8. The probe card assembly of claim 1 , wherein the plurality of lower stiffeners are disposed radially outward of the upper stiffener.
9. A probe card assembly, comprising:
a stiffener assembly comprising an upper stiffener coupled to a plurality of lower stiffeners; and
a substrate constrained between the upper stiffener and the plurality of lower stiffeners, the substrate being in direct physical contact with the plurality of lower stiffeners, the stiffener assembly restricting non-planar flex of the substrate while facilitating radial movement of the substrate with respect to the stiffener assembly,
wherein the upper stiffener further comprises a plurality of extensions, each extension coupled to a respective one of the plurality of lower stiffeners,
wherein the substrate further comprises a plurality of slots formed about a periphery of the substrate, each slot having a respective one of the plurality of extensions disposed therein, and
wherein each lower stiffener further includes a flange that is larger than each corresponding slot such that the lower stiffeners cannot pass through the slots.
10. The probe card assembly of claim 9 , wherein the substrate further comprises:
a shelf formed in each slot, the shelves sized to interface with the flanges of the plurality of lower stiffeners.
11. The probe card assembly of claim 9 , wherein the upper stiffener and the plurality of lower stiffeners are coupled together through the substrate.
12. The probe card assembly of claim 9 , wherein the upper stiffener further comprises:
a plurality of radially extending arms, each arm having an extension coupling the upper stiffener to the plurality of lower stiffeners.
13. The probe card assembly of claim 12 , wherein the plurality of radially extending arms of the upper stiffener extend outward from the upper stiffener.
14. The probe card assembly of claim 9 , wherein the plurality of lower stiffeners are disposed radially with respect to a central axis of the stiffener assembly.
15. The probe card assembly of claim 9 , wherein the plurality of lower stiffeners are disposed radially outward of the upper stiffener.
16. A method of using a probe card assembly, comprising:
providing a probe card assembly having a stiffener assembly comprising an upper stiffener coupled to a plurality of lower stiffeners, a substrate in direct physical contact with each of the lower stiffeners and constrained between the upper stiffener and the lower stiffeners, and a probe substrate coupled to the substrate, the probe substrate having a plurality of resilient contact elements extending therefrom; and
heating the probe card assembly, wherein the stiffener assembly restricts non-planar flex of the substrate while facilitating radial movement of the substrate with respect to the stiffener assembly due to differences in thermal expansion between the stiffener assembly and the substrate.
17. The method of claim 16 , further comprising:
applying a downward force to an upper surface of the probe card assembly.
18. The method of claim 16 , further comprising:
applying an upward force to a lower surface of the probe card assembly.
19. The method of claim 18 , wherein the step of applying an upward force comprises:
bringing the resilient contact elements into contact with respective terminals of the device to be tested.
20. The method of claim 16 , wherein the plurality of lower stiffeners are disposed radially with respect to a central axis of the stiffener assembly.
21. The method of claim 16 , wherein the plurality of lower stiffeners are disposed radially outward of the upper stiffener.
22. The method of claim 16 , wherein the upper stiffener further comprises a plurality of radially extending arms, each arm having an extension coupling the upper stiffener to the plurality of lower stiffeners wherein the plurality of radially extending arms of the upper stiffener extend outwards from the upper stiffener.
23. A probe card assembly, comprising:
a stiffener assembly comprising an upper stiffener coupled to a plurality of lower stiffeners; and
a substrate constrained between the upper stiffener and the plurality of lower stiffeners, the substrate being in direct physical contact with the plurality of lower stiffeners, the stiffener assembly restricting non-planar flex of the substrate while facilitating radial movement of the substrate with respect to the stiffener assembly,
wherein:
the upper stiffener comprises an outer member coupled to the plurality of lower stiffeners, and an inner member disposed within an opening in the outer member,
there being a gap between the inner member and the outer member.
24. The probe card assembly of claim 23 , wherein the upper stiffener further comprises a plurality of flexures mechanically connecting the inner member and the outer member.
25. The probe card assembly of claim 23 further comprising a plurality of probe substrates each having a plurality of resilient contact elements extending therefrom, wherein the probe substrates are directly coupled to the inner member.
26. A probe card assembly, comprising:
a stiffener assembly comprising an upper stiffener coupled to a plurality of lower stiffeners; and
a substrate constrained between the upper stiffener and the plurality of lower stiffeners, the substrate being in direct physical contact with the plurality of lower stiffeners, the stiffener assembly restricting non-planar flex of the substrate while facilitating radial movement of the substrate with respect to the stiffener assembly,
wherein:
the substrate comprises a plurality of slots, and each of the slots comprises a shelf disposed within the slot, and
each of the lower stiffeners is disposed in one of the slots and comprises a flange in contact with the shelf of the one of the slots and an extension that extends through the one of the slots to the upper stiffener.