Validating the error map of CMM using calibrated probe

1. A method for validating an error map of a coordinate measuring machine using a calibrated probe, the probe capable of rotation about at least one axis, the method comprising the steps of:

placing a calibration artifact at a first artifact position on a table of the coordinate measuring machine, the table having an upper surface in an XY plane;

positioning a Z-rain of the coordinate measuring machine in a first calibration position and a second calibration position with respect to the artifact such that the probe contacts the artifact, wherein the probe moves relative to the Z-ram such that the calibration artifact remains stationary while the Z-ram is positioned in the first calibration position and the second calibration position;

calculating a first measured value representing the measured length between the first and second calibration positions of the Z-ram;

calculating a first nominal value based on the length of the probe;

comparing the first nominal value to the first measured value; and

updating the error map of the coordinate measuring machine if the measured value differs from the nominal value by more than a predetermined value.

2. The method according to claim 1 , wherein the positioning step includes positioning the z-ram in the second calibration position disposed 180° about the artifact from the first calibration position.

3. The method according to claim 2 , wherein the positioning step includes positioning the Z-ram in the first calibration position wherein the Z-ram is disposed in a plane parallel to the XY plane along a radial axis, the radial axis being disposed parallel to a line that is substantially 45° from the X axis of the table, and wherein the step of calculating the first measured value includes calculating the Euclidean distance between the first calibration position and the second calibration position.

4. The method according to claim 2 , wherein the positioning step includes positioning the Z-ram in a third calibration position disposed 90° about the artifact from the first calibration position.

5. The method according to claim 4 , wherein the positioning step includes positioning the Z-ram in a first calibration position wherein the Z-ram is disposed in a plane parallel to the XY plane along a tangential axis, the radial axis being disposed parallel to a line that is substantially 135° from the X axis of the table, and wherein the step of calculating the measured value includes calculating the Euclidean distance between the third calibration position and a fourth calibration position.

6. The method according to claim 4 , further comprising:

positioning the Z-ram in a fourth calibration position disposed 180° about the artifact from the third calibration position; and

calculating a second measured value representing the measured length between the third and fourth calibration positions; wherein

comparing the first nominal value to the first measured value comprises comparing the first nominal value to the difference between the first and second measured values to determine a squareness error.

7. The method according to claim 6 , wherein updating the error map of the coordinate measuring machine if the measured value differs from the nominal value by more than a predetermined value comprises updating the error map of the coordinate measuring machine if a squareness error is above a predetermined threshold.

8. The method according to claim 1 , wherein the step of calculating the first measured value includes calculating the Euclidean distance between the first calibration position and the second calibration position.

9. The method according to claim 8 , wherein the step of calculating the first measured value includes adjusting for calibration information associated with the probe.

10. The method according to claim 1 , wherein the step of calculating a first nominal value includes calculating at least one of 2·SL·cos(α) and 2·SL·cos(α)+TL, where α is the angle between a stylus of the probe and the Z axis of the Z-ram, SL is the known stylus length and TL is the touch length, which is the distance between points of contact of the stylus on the artifact.

11. The method according to claim 1 , further comprising moving the calibration artifact to a second artifact position, different from the first artifact position, on the table;

positioning the Z-ram of the coordinate measuring machine in a third calibration position and a fourth calibration position with respect to the artifact such that the probe contacts the artifact, wherein the probe moves relative to the Z-ram such that the calibration artifact remains stationary while the Z-ram is positioned in the third calibration position and the fourth calibration position;

calculating a second measured value representing the measured length between the third and fourth calibration positions;

calculating a second nominal value based on the length of the probe;

comparing the second nominal value to the second measured value; and

updating the error map of the coordinate measuring machine if the second measured value differs from the nominal value by more than a predetermined value.

12. The method according to claim 1 , wherein the step of positioning the Z-ram of the coordinate measuring machine in a first calibration position and a second calibration position is repeated for diagonals in each of XY-, YZ-, and XZ planes.