IP Library Granted Patent US 7,863,762
Granted Patent B2
US 7,863,762 · App. 11/874,907 · Granted Jan 4, 2011

Method of packaging and interconnection of integrated circuits

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Quick Facts
Patent No.
US 7,863,762
App. No.
11/874,907
Granted
Jan 4, 2011
Kind
B2
Abstract

A method is disclosed for packaging semiconductor chips on a flexible substrate employing thin film transfer. The semiconductor chips are placed on a temporary adhesive substrate, then covered by a permanent flexible substrate with a casting layer for planarizingly embedding the chips on the permanent substrate before removing the temporary substrate. With the surface of the chips coplanar with the surface of the complete structure without any gaps, interconnect metal lines can be easily placed on the uninterrupted surface, connecting the chips and other components.

Claims (28)

1. A coplanar, gapless semiconductor chip packaging structure comprising a plurality of semiconductor chips embedded in a substrate through a curable layer, the curable layer covering an entire top surface of the substrate,

wherein each of the chips comprises a plurality of exposed contact pads on a top surface thereof, having respective top surface being coplanar with the top surface of each of the chips;

wherein the top surface of each of the chips is coplanar with a top surface of the curable layer and there is no gap at the sides of each of the chips, forming a planar, uninterrupted surface, and a plurality of interconnect lines connecting the exposed contact pads, wherein the curable layer entirely covers all sides and a bottom of each of the chips.

2. A structure as in claim 1 wherein the curable layer has a coefficient of thermal expansion similar to that of silicon.

3. A structure as in claim 1 wherein the curable layer partially covers the bottom of the semiconductor chips.

4. A structure as in claim 1 wherein the interconnect lines connecting the top exposed contact pads are planar.

5. A structure as in claim 1 wherein the curable layer is disposed on the chips before applying the substrate.

6. A structure as in claim 1 wherein the curable layer completely covers the chips and the substrate so that the substrate surface is not exposed.

7. A structure as in claim 1 wherein the curable layer covers only the sides of the chips.

8. A flexible chip packaging structure comprising

a flexible substrate;

a plurality of semiconductor chips embedded in the flexible substrate through a curable layer covering an entire top surface of the substrate,

wherein each of the semiconductor chips comprises a plurality of exposed contact pads on a top surface thereof, having respective top surface being coplanar with the top surface of each of the semiconductor chips;

wherein the top surface of each of the semiconductor chips is coplanar with a top surface of the curable layer and there is no gap at the sides of each of the semiconductor chips, forming a planar, uninterrupted surface, and a plurality of interconnect lines connecting the exposed contact pads, wherein the curable layer entirely covers all sides and a bottom of each of the semiconductor chips.

9. A structure as in claim 8 wherein the curable layer has a coefficient of thermal expansion similar to that of silicon.

10. A structure as in claim 8 wherein the interconnect lines connecting the top exposed contact pads are planar.

11. A structure as in claim 8 wherein the curable layer is disposed on the chips before applying the substrate.

12. A structure as in claim 8 wherein the curable layer completely covers the chips and the substrate so that the substrate surface is not exposed.

13. A structure as in claim 8 wherein the curable layer covers only the sides of the chips.

14. A structure as in claim 8 wherein the curable layer partially covers the bottom of the semiconductor chips.

15. A semiconductor structure comprising:

a plurality of semiconductor chips embedded in a substrate through a curable layer, the curable layer covering an entire top surface of the substrate,

wherein each of the semiconductor chips comprises a plurality of exposed contact pads on a top surface thereof, having respective top surface being coplanar with the top surface of each of the semiconductor chips, and

wherein the top surface of each of the semiconductor chips is coplanar with a top surface of the curable layer and there is no gap at the sides of each of the semiconductor chips, forming a planar, uninterrupted surface; and

a plurality of planar interconnect lines connecting the exposed contact pads, wherein the curable layer entirely covers all sides and a bottom of each of the semiconductor chips.

16. A structure as in claim 15 wherein the curable layer completely covers the semiconductor chips and the substrate so that the substrate surface is not exposed.

17. A structure as in claim 15 wherein the curable layer covers only the sides of the semiconductor chips.

18. A structure as in claim 15 wherein the curable layer partially covers the bottom of the semiconductor chips.

Assignments (6)
LICENSE Recorded Oct 14, 2020
From: LOST ARROW CONSULTING LLC
To: TERECIRCUITS CORPORATION
Reel/Frame 054055/0883 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 10, 2020
From: LOST ARROW CONSULTING LLC
To: TERECIRCUITS CORPORATION
Reel/Frame 052889/0716 →
RELEASE OF SECURITY INTEREST Recorded Nov 27, 2019
From: WESTERN ONTARIO COMMUNTY FUTURE DEVELOPMENT CORPORATION ASSOCIATION
To: LOST ARROW CONSULTING LLC
Reel/Frame 051132/0172 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 15, 2019
From: SHEATS, JAYNA
To: INTELLEFLEX CORPORATION
Reel/Frame 051017/0866 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 15, 2019
From: INTELLEFLEX CORPORATION
To: LOST ARROW CONSULTING LLC
Reel/Frame 051018/0326 →
SECURITY INTEREST Recorded Nov 6, 2014
From: LOST ARROW CONSULTING LLC
To: WESTERN ONTARIO COMMUNITY FUTURES DEVELOPMENT CORPORATION ASSOCIATION
Reel/Frame 034120/0352 →
Continuity (2)
Division 1120660600 · Aug 18, 2005
Related Publication 20080036066A1 · Feb 14, 2008