System and method for time domain reflectometry testing

1. A method for performing time domain reflectometry (TDR) testing on an electronic component, the method comprising:

applying a TDR test on the electronic component to generate resulting test data;

deriving return loss data from the resulting test data;

evaluating the return loss data and determining that a standard requirement has not been satisfied; and

simulating a correction operation by:

identifying a first portion of the resulting test data that corresponds to a first defective portion of the electronic component,

modifying the first portion of the resulting test data,

deriving modified return loss data from the modified first portion of the resulting test data, and

evaluating the modified return loss data and determining that the standard requirement has been satisfied,

wherein the first defective portion of the electronic component can be corrected based on the modified first portion of the resulting test data.

2. The method of claim 1 , wherein the first portion of the resulting test data corresponds to a peak, a dip, a resonance, or a level shift from a required value.

3. The method of claim 1 , wherein modifying the first portion of the resulting test data includes changing the first portion to an expected test value for satisfying the standard requirement.

4. The method of claim 3 , wherein changing the first portion to an expected test value is performed by a user or a software program.

5. The method of claim 1 , wherein evaluating the modified return loss data and determining that the standard requirement has been satisfied comprises evaluating the modified return loss data against a threshold reference.

6. The method of claim 1 , wherein the resulting test data correspond to sampled values of a reflection signal returned by the electronic component when the TDR test is applied.

7. The method of claim 1 , further comprising correcting the first defective portion of the electronic component based on the modified first portion of the resulting test data.

8. A computer testing system, comprising:

a memory for storing test data resulted from a time domain reflectometry test applied on an electronic component; and

a processing unit configured to:

derive return loss data from the resulting test data;

evaluate the return loss data and determining that a standard requirement has not been satisfied; and

simulate a correction operation by:

identifying a first portion of the resulting test data that corresponds to a first defective portion of the electronic component,

modifying the first portion of the resulting test data,

deriving modified return loss data from the modified first portion of the resulting test data, and

evaluating the modified return loss data and determining that the standard requirement has been satisfied,

wherein the first defective portion of the electronic component can be corrected based on the modified first portion of the resulting test data.

9. The system of claim 8 , wherein the first portion of the resulting test data corresponds to a peak, a dip, a resonance, or a level shift from a required value.

10. The system of claim 8 , wherein the processing unit is configured to change the first portion of the resulting test data to an expected test value for satisfying the standard requirement.

11. The system of claim 8 , wherein the processing unit is configured to change the first portion based on an input that is defined either by a user or in a software program.

12. The system of claim 8 , wherein, to evaluate the modified return loss data and determine that the standard requirement has been satisfied, the processing unit is configured to evaluate the modified return loss data against a threshold reference.

13. The system of claim 8 , wherein the resulting test data correspond to sampled values of a reflection signal returned by the electronic component when the time domain reflectometry test is applied.

14. A non-transitory computer-readable medium containing a sequence of instructions executable within a computer testing system including a processing unit and a physical memory for storing test data resulted from a time domain reflectometry test applied on an electronic component, wherein the sequence of instructions, when executed by the processing unit, causes the processing unit to:

derive return loss data from the resulting test data;

evaluate the return loss data and determining that a standard requirement has not been satisfied; and

simulate a correction operation by:

identifying a first portion of the resulting test data that corresponds to a first defective portion of the electronic component,

modifying the first portion of the resulting test data,

deriving modified return loss data from the modified first portion of the resulting test data, and

evaluating the modified return loss data and determining that the standard requirement has been satisfied,

wherein the first defective portion of the electronic component can be corrected based on the modified first portion of the resulting test data.

15. The non-transitory computer-readable medium of claim 14 , further containing a sequence of instructions, which when executed by the processing unit in the computer testing system, causes the processing unit to change the first portion of the resulting test data to an expected test value for satisfying the standard requirement.

16. The non-transitory computer-readable medium of claim 14 , further containing a sequence of instructions, which when executed by the processing unit in the computer testing system, causes the processing unit to evaluate the modified return loss data against a threshold reference.