IP Library Granted Patent US 7,442,569
Granted Patent B2
US 7,442,569 · App. 11/878,503 · Granted Oct 28, 2008

Vertical GaN-based LED and method of manufacturing the same

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Quick Facts
Patent No.
US 7,442,569
App. No.
11/878,503
Granted
Oct 28, 2008
Kind
B2
Abstract

Provided are a vertical GaN-based LED and a method of manufacturing the same. The vertical GaN-based LED includes an n-electrode. An AlGaN layer is formed under the n-electrode. An undoped GaN layer is formed under the AlGaN layer to provide a two-dimensional electron gas layer to a junction interface of the AlGaN layer. A GaN-based LED structure includes an n-type GaN layer, an active layer, and a p-type GaN layer that are sequentially formed under the undoped GaN layer. A p-electrode is formed under the GaN-based LED structure. A conductive substrate is formed under the p-electrode.

Claims (20)

1. A method of manufacturing a vertical GaN-based LED, the method comprising:

forming a GaN-based buffer layer on a sapphire substrate;

forming an undoped GaN layer on the GaN-based buffer layer to obtain crystallinity;

forming an AlGaN layer on the undoped GaN layer;

forming an undoped GaN layer on the AlGaN layer so as to form a 2DEG layer at a junction interface of the AlGaN layer;

sequentially forming an n-type GaN layer, an active layer, and a p-type GaN layer on the undoped GaN layer to form a GaN-based LED structure;

forming a p-electrode on the GaN-based LED structure;

attaching a conductive substrate onto the p-electrode;

removing the sapphire substrate and the GaN-based buffer layer through a laser lift-off (LLO) process, and removing the undoped GaN layer from the AlGaN layer through a chemical mechanical polishing (CMP) process; and

forming an n-electrode on the AlGaN layer from which the undoped GaN layer has been removed.

2. The method according to claim 1 further comprising,

before the forming of the GaN-based buffer layer on the sapphire layer, performing a pre-treatment process on the sapphire substrate such that the surface of the GaN-based buffer layer's surface contacting a top surface of the sapphire substrate has a Ga-face structure in which nitrogen (N) elements are disposed on a vertical uppermost layer of gallium elements.

3. The method according to claim 2 ,

wherein the pre-treatment process is performed using Trimethylgallium (TMGa).

4. The method according to claim 3 ,

wherein the pre-treatment process is performed for 30 seconds through 120 seconds.

5. The method according to claim 1 further comprising

annealing the AlGaN layer in an oxygen atmosphere after the forming of the AlGaN layer.

6. The method according to claim 1 further comprising

forming a reflective layer on the p-electrode before the attaching of the conductive substrate onto the p-electrode.

Assignments (2)
MERGER Recorded Aug 7, 2012
From: SAMSUNG LED CO., LTD.
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 028744/0272 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 12, 2010
From: SAMSUNG ELECTRO-MECHANICS CO., LTD.
To: SAMSUNG LED CO., LTD.
Reel/Frame 024375/0448 →