High-frequency acoustic wave device

1. A method for determining an acoustic wave device comprising a piezoelectric layer on an acoustic mirror, comprising the steps of:

for a given pair of materials forming the acoustic mirror on a given substrate, calculating a dispersion curve linking the frequency of an acoustic wave in said acoustic mirror to the wavelength of said acoustic wave in said acoustic mirror and selecting the value of the sum of the thicknesses of a layer of each material in the pair of materials so that a stacking of the pair of materials forms an omnidirectional mirror having a band gap in a target frequency band; and

selecting the thickness of the piezoelectric layer so that the mirror remains omnidirectional and that the piezoelectric layer has an acoustic vibration mode in the frequency band gap of the mirror.

2. The method of claim 1 , wherein stacking the pair of materials includes stacking materials having alternating high and low acoustic impedance levels.

3. The method of claim 2 , wherein the thickness of a pair of said alternated high and low acoustic impedance materials is selected according to a ratio between the thickness of said pair of said alternated high and low acoustic impedance materials and the wavelength of an acoustic wave in a structure comprising the omnidirectional acoustic mirror and a substrate.

4. The method of claim 1 , further comprising the step of selecting an alternate band gap by proportionally increasing the omnidirectional mirror pitch, wherein the pitch is defined by the sum of the thicknesses of each material layer forming the omnidirectional mirror.

5. The method of claim 1 , wherein the piezoelectric layer is formed from aluminum nitride (AIN).

6. The method of claim 1 , wherein the piezoelectric layer is formed from at least one of lithium niobate (LiNbO 3 ), zinc oxide (ZnO), and potassium niobate (KNbO 3 ).