IP Library Granted Patent US 7,616,474
Granted Patent B2
US 7,616,474 · App. 11/898,890 · Granted Nov 10, 2009

Offset compensated sensing for magnetic random access memory

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Quick Facts
Patent No.
US 7,616,474
App. No.
11/898,890
Granted
Nov 10, 2009
Kind
B2
Abstract

An offset compensated memory element voltage supply including a differential amplifier with a compensation circuit, and a transistor with a gate connected to the output of the differential amplifier. The compensation circuit of the differential amplifier includes a compensation capacitor that stores a compensation voltage during a calibration phase, and applies the stored compensation voltage to a compensation input of the compensation circuit of the amplifier during a measurement phase. Feedback from a source of the transistor controls the output of the differential amplifier to maintain a standard voltage across a resistive memory element connected to the source during measurement of the resistance of the resistive memory element, and the compensation circuit improves the accuracy of the voltage across the resistive memory element by compensating for an offset voltage of the differential amplifier.

Claims (59)

1. A voltage source for a resistive memory device, the resistive memory device having a plurality of row lines and resistive memory elements, the voltage source comprising:

a pull-up voltage circuit for maintaining at least one row line at a predetermined array voltage, the pull-up voltage circuit comprising:

a first differential amplifier operatively connected to a reference voltage; and

a second differential amplifier operatively connected to a compensation voltage and an output of the first differential amplifier.

2. The voltage source of claim 1 , wherein the first differential amplifier comprises:

a pull-up resistor electrically connected to a supply voltage;

an output connected to the resistor;

an inverting transistor connected to the output and controlled by an inverting input;

a non-inverting transistor connected to the supply voltage and controlled by a non- inverting input;

a first current source connected between the inverting and non-inverting transistors and ground; and

an offset voltage source connected to a gate of the non-inverting transistor. transistor.

3. The voltage source of claim 2 , wherein the second differential amplifier comprises:

a first compensation transistor connected to the inverting transistor and the output of the first differential amplifier;

a second compensation transistor connected to the non-inverting transistor;

a second current source connected between the compensation transistors and ground;

a first compensation capacitor connected to a gate of the first compensation transistor; and

a second compensation capacitor connected to a gate of the second compensation transistor.

4. A compensated differential amplifier device comprising:

a first differential amplifier comprising:

a pull-up resistor electrically connected to a supply voltage;

an output electrically connected to the resistor;

an inverting transistor, the inverting transistor comprising:

a gate connected to an inverting input;

a first source/drain region electrically connected to the output; and

a second source/drain region;

a non-inverting transistor comprising:

a gate connected to a non-inverting input;

a first source/drain region electrically connected to the supply voltage; and

a second source/drain region;

a first current source comprising:

a first terminal connected to the second source/drain region of the inverting transistor and the second source/drain connection of the non- inverting transistor; and

a second terminal connected to ground; and

an offset voltage source connected to the gate of the non-inverting transistor; and

a second differential amplifier comprising:

a first compensation transistor comprising:

a first source/drain region electrically connected to the first source/drain region of the inverting transistor and to the output of the first differential amplifier;

a second source/drain region; and

agate;

a second compensation transistor comprising:

a first source/drain region electrically connected to the first source/drain region of the non-inverting transistor;

a second source/drain region; and

a gate;

a second current source comprising:

a first terminal connected to the second source/drain region of the inverting transistor and the second source/drain connection of the non- inverting transistor; and

a second terminal connected to ground; and

a first compensation capacitor comprising:

a first terminal electrically connected to the gate of the first compensation transistor; and

a second terminal connected to ground; and

a second compensation capacitor comprising:

a first terminal electrically connected to the gate of the second compensation transistor; and

a second terminal connected to ground.

5. The compensated differential amplifier device of claim 4 , wherein a second source/drain region of the non-inverting transistor is connected to a complementary output.

6. A control circuit for controlling an amplifier in a resistive memory device, the control circuit comprising:

a first phase output operatively connected to a first plurality of switches; and

a second phase output operatively connected to a second plurality of switches,

wherein the control circuit is operable to alternate between a calibration mode configuration and a resistive element measurement mode configuration.

7. The control circuit of claim 6 , wherein the control circuit is operable to place the amplifier in the calibration mode at the beginning of each read cycle.

8. The control circuit of claim 6 , wherein the control circuit is operable to place the amplifier in the calibration mode prior to a first read, and then operable to return the amplifier to the calibration mode only after a predefined number of read cycles.

9. The control circuit of claim 6 , wherein the control circuit is operable to place the amplifier in the calibration mode prior to a first read cycle, and then operable to return the amplifier to the calibration mode only after a definite value of voltage offset is sensed on an output.

Assignments (7)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →