IP Library Granted Patent US 7,914,202
Granted Patent B2
US 7,914,202 · App. 11/930,963 · Granted Mar 29, 2011

First detecting sheet and first thermometric system for detecting and measuring temperature of an object under test, second detecting sheet and second thermometric system for detecting and measuring temperature of a dummy substrate, and heat treatment apparatus using same

Assignee: Sokudo Co., Ltd.
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Quick Facts
Patent No.
US 7,914,202
App. No.
11/930,963
Granted
Mar 29, 2011
Kind
B2
Abstract

A first thermometry system for measuring a temperature of an object under test includes a first detecting sheet having crystal oscillators arranged on a first sheet-like object formed of resin, and a first measuring device for measuring the temperature based on frequencies acquired from the crystal oscillators and corresponding to natural frequencies of the crystal oscillators. In this system, the first detecting sheet is placed in contact with the object under test, whereupon the crystal oscillators provide the natural frequencies corresponding to the temperature of the object under test. The first measuring device measures the temperature of the object under test accurately based on the frequencies corresponding to the natural frequencies.

Claims (20)

1. A detecting sheet for supporting a dummy substrate, comprising:

a sheet-like object formed of resin and laid to cover the upper surface of a heat-treating plate for supporting the dummy substrate, said dummy substrate including thermometric elements each with a crystal oscillator having at least a coil or an antenna connected thereto; and

sensor coils arranged in said sheet-like object for wireless communication with said thermometric elements.

2. A sheet as defined in claim 1 , wherein said sensor coils are mounted inside said sheet-like object.

3. A sheet as defined in claim 1 , wherein:

said sheet-like object has projections formed thereon for contacting and supporting the dummy substrate; and

said sensor coils are mounted in said projections.

4. A sheet as defined in claim 1 , wherein said sensor coils are arranged to oppose said thermometric elements when the dummy substrate is placed on the detecting sheet.

5. A sheet as defined in claim 1 , further comprising:

wires arranged inside said sheet-like object and connected to said sensor coils; and

an output terminal for connecting said wires to an external circuit.

6. A thermometric system for measuring a temperature of a dummy substrate including thermometric elements each with a crystal oscillator having at least a coil or an antenna connected thereto, said system comprising:

a sheet-like object formed of resin and laid to cover the upper surface of a heat-treating plate for supporting the dummy substrate;

sensor coils arranged in said sheet-like object for wireless communication with said thermometric elements; and

a measuring device for measuring the temperature based on frequencies of electromagnetic waves received by said sensor coils.

7. A system as defined in claim 6 , wherein said sensor coils are mounted inside said sheet-like object.

8. A system as defined in claim 6 , wherein:

said sheet-like object has projections formed thereon for contacting and supporting the dummy substrate; and

said sensor coils are mounted in said projections.

9. A system as defined in claim 6 , wherein said measuring device includes a communication device for causing said sensor coils to send transmitter pulses with frequencies corresponding to natural frequencies of said crystal oscillators, and detecting the electromagnetic waves received by said sensor coils.

Assignments (2)
CHANGE OF NAME Recorded Nov 5, 2014
From: SOKUDO CO., LTD.
To: SCREEN SEMICONDUCTOR SOLUTIONS CO., LTD.
Reel/Frame 034150/0849 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 28, 2008
From: KAMEI, KENJI
To: SOKUDO CO., LTD.
Reel/Frame 020424/0611 →
Priority Claims (2)
JP 2006-322172 · Nov 29, 2006 · national
JP 2006-328310 · Dec 5, 2006 · national
Continuity (1)
Related Publication 20080279250A1 · Nov 13, 2008