IP Library Granted Patent US 7,866,205
Granted Patent B2
US 7,866,205 · App. 11/932,222 · Granted Jan 11, 2011

Sample operation apparatus

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Quick Facts
Patent No.
US 7,866,205
App. No.
11/932,222
Granted
Jan 11, 2011
Kind
B2
Abstract

There is provided a sample operation apparatus in which, by a static electricity force acting between a probe and a sample, an accurate position is gripped without the sample being moved, and the sample can be operated by the probe for an observation, a grip, a release, or the like. In a casing body capable of being sealed, there are installed a sample operation tweezers comprising an observation probe and a grip probe, and a sample base fixing a substrate on which the sample is mounted. By the facts that a surface of the substrate is treated such that its hydrophilic nature is higher than the sample operation tweezers, and that a humidity in the casing body is controlled by a humidity control device, there is made such that an actuation of a grip, a movement, a separation or the like of the sample is performed under a state in which water films are formed on the sample, the substrate and a surface of the sample operation tweezers.

Claims (14)

1. A sample operation apparatus having:

a casing body capable of being sealed,

a sample operation tweezers comprising an observation probe having a tip , and a grip probe provided while adjoining the observation probe with a predetermined distance,

a sample base fixing a substrate on which a sample is mounted,

the sample operation tweezers and the sample base being possessed in the casing body,

a humidity control device controlling a humidity in the casing body,

a displacement detection means detecting a displacement of the observation probe, and

a three-dimensional movement means moving the observation probe or the grip probe in three-dimensional directions relative to a surface of the sample base,

wherein the sample operation tweezers is made such that its hydrophilic nature becomes lower than the substrate.

2. A sample operation apparatus according to claim 1 , wherein the sample operation tweezers has an electrical conductivity and is grounded.

3. A sample operation apparatus according to claim 1 , wherein the sample base is grounded.

4. A sample operation apparatus according to claim 1 , wherein the sample operation tweezers has a surface treated so as to become water-repellent.

5. A sample operation apparatus according to claim 1 , wherein the grip probe has a heating part.

6. A sample operation apparatus according to claim 1 , wherein the sample base possesses a sample base temperature control mechanism controlling a temperature of the sample base.

Assignments (2)
CHANGE OF NAME Recorded Sep 17, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033764/0615 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 25, 2008
From: YASUTAKE, MASATOSHI; UMEMOTO, TAKESHI
To: SII NANO TECHNOLOGY INC.
Reel/Frame 020419/0067 →