Anti-tamper mesh
A method of forming an anti-tamper mesh on an electronic device. The method includes forming at least one terminal on the electronic device and forming a conductive mesh on at least one surface of the electronic device, wherein the conductive mesh is in electrical contact with the terminal, and wherein the terminal facilitates electrical conduction between the conductive mesh and an electrical detection circuit.
1. An electronic device, comprising:
a conductive pattern formed on the electronic device to detect tampering of the electronic device, the electronic device comprising at least one of a semiconductor device, an integrated circuit chip, and an electronic substrate;
at least one terminal formed on the electronic device; and
a non-conductive layer formed on the electronic device;
wherein the conductive pattern is formed on the non-conductive layer and on at least two surfaces of the electronic device, wherein the conductive pattern comprises a plurality of closed conductive traces, and wherein each one of the plurality of closed conductive traces is formed on each one of the at least two surfaces of the electronic device and is continuous therebetween;
wherein the conductive pattern is electrically connected to the at least one terminal, and wherein the at least one terminal facilitates electrical conduction between the conductive pattern and an electrical detection circuit of the electronic device.
2. The electronic device of claim 1 , wherein the conductive pattern is formed of a curable polymeric material.
3. The electronic device of claim 1 , comprising a plurality of conductive patterns arranged in layers, wherein a non-conductive layer is formed between adjacent layers of the conductive patterns.
4. The electronic device of claim 3 , wherein the non-conductive layer comprises a dielectric material.
5. The electronic device of claim 4 , wherein the dielectric material has elastomeric properties.
6. The electronic device of claim 1 , wherein the electrical detection circuit is configured to detect a change in at least one of a resistance and a conductance of the conductive pattern.
7. The electronic device of claim 3 , wherein the electrical detection circuit is configured to detect a change in capacitance caused by a disruption of at least one of a conductive pattern and a non-conductive layer.
8. The electronic device of claim 1 , wherein the conductive pattern is arranged in one of a crisscross pattern, a crosshatch pattern, a serpentine pattern, a wave-like pattern, a comb pattern, a multi-comb pattern, and a random swirl pattern.