Statistical yield of a system-on-a-chip
View Patent ↗Improving statistical yield of a system-on-a-chip. The system-on-a-chip includes several memory systems. Each memory system includes a large number of memories. The memories are tested to identify any faulty memories. One or more margins of the faulty memories are then varied and the memories are then tested again.
1. A method for improving statistical yield of a system-on-a-chip, the system-on-a-chip comprising at least one memory, the method comprising:
determining at least one faulty memory;
varying one or more margins of the at least one faulty memory; and
testing the at least one faulty memory with varied one or more margins.
2. The method of claim 1 , wherein determining the at least one faulty memory comprises determining one or more faulty columns in the at least one faulty memory.
3. The method of claim 1 , wherein varying the one or more margins comprises varying one or more read margins.
4. The method of claim 1 , wherein varying the one or more margins comprises varying one or more write margins.
5. The method of claim 1 , wherein varying the one or more margins comprises setting a bit of one or more enhance registers.
6. The method of claim 1 , wherein varying the one or more margins comprises modifying connection of at least one bit cell mimicking structure.
7. The method of claim 1 further comprising:
determining how many columns are faulty in the at least one faulty memory with varied one or more margins; and
repairing the at least one faulty memory with varied one or more margins based on how many columns were determined to be faulty.
8. The method of claim 1 further comprising testing the at least one memory.
9. The method of claim 1 further comprising determining types of failures in the at least one faulty memory.
10. The method of claim 1 further comprising storing and updating fault information of the at least one faulty memory.
11. A method comprising:
identifying a plurality of faulty columns in a memory;
varying one or more margins of the memory based on types of failures of the plurality of faulty columns; and
testing the memory with varied one or more margins.
12. A system comprising:
at least one memory;
one or more enhance registers corresponding to the at least one memory for indicating one or more margins that must be varied;
a processor, the processor varying the one or more margins of at least one faulty memory; and
at least one test wrapper, the at least one test wrapper testing at least one faulty memory with varied one or more margins.
13. A computer program product comprising:
a machine-readable medium; and
instructions carried by the machine readable medium and operable to cause a programmable processor to:
determine at least one faulty memory;
vary one or more margins of the at least one faulty memory; and
send a command to test at least one faulty memory with varied one or more margins.
14. The computer program product of claim 13 , wherein the instructions carried by the machine readable medium is operable to cause the programmable processor to determine the at least one faulty memory by identifying one or more faulty columns in the at least one faulty memory.
15. The computer program product of claim 13 , wherein the instructions carried by the machine readable medium is operable to cause the programmable processor to vary the one or more margins by varying one or more write margins.
16. The computer program product of claim 13 , wherein the instructions carried by the machine readable medium is operable to cause the programmable processor to vary the one or more margins by varying one or more read margins.
17. The computer program product of claim 13 , wherein the instructions carried by the machine readable medium is operable to cause the programmable processor to vary the one or more margins by setting a bit of one or more enhance registers.
18. The computer program product of claim 13 , wherein the instructions carried by the machine readable medium is operable to cause the programmable processor to vary the one or more margins by modifying a connection of at least one bit cell mimicking structure.
19. The computer program product of claim 13 , wherein the instructions carried by the machine readable medium is operable to cause the programmable processor to:
determine how many columns are faulty in the at least one faulty memory with varied one or more margins; and
repair the at least one faulty memory with varied one or more margins based on how many columns were determined to be faulty.
20. The computer program product of claim 13 , wherein the instructions carried by the machine readable medium is operable to cause the programmable processor to determine types of failures in the at least one faulty memory.